Microscopy Morphology — Metal-organic framework transistors for dopamine sensing

Measurement evidence

Microscopy Morphology

Metal-organic framework transistors for dopamine sensing · Song J., Zheng J., Yang A. et al. · Materials Chemistry Frontiers · 2021 · 3422-3427

2 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and AFM

15-cycle Cu3(HHTP)2 film on glass · Thin Film

Top-view SEM and AFM of 15-cycle Cu3(HHTP)2 film on glass and SEM check on Au electrode.

Geometry
thin film on glass and Au electrode
Context
pristine Cu3(HHTP)2 film
Measurement source
p002-p003 / 3423-3424 · Results and discussion · Fig. 2c-d, Fig. S2, Fig. S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average surface roughness8.54 nmText
Exact Reported
p003 / 3424 · Results and discussion · Fig. 2d
SEM morphologycontinuous and dense filmText
Qualitative
p002 / 3423 · Results and discussion · Fig. 2c

surface profilometry

15-cycle Cu3(HHTP)2 film on glass · Thin Film

Film thickness measured for different growth cycles; Bruker DektakXT surface profiler.

Geometry
thin film on glass
Context
pristine Cu3(HHTP)2 film
Measurement source
p002 / 3423 · Results and discussion · Fig. S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
film growth rate per layer-by-layer cycleB10 nm per cycleText
Approximate
p002 / 3423 · Results and discussion · Fig. S1
film thickness after 10 cycles96 nmFigure Axis
Approximate
p001 · Supporting Information · Fig. S1b
film thickness after 15 cycles158 nm (main text/caption also reports B150 nm)Figure Axis
Approximate
p001 · Supporting Information · Fig. S1c
film thickness after 20 cycles200 nmFigure Axis
Approximate
p001 · Supporting Information · Fig. S1d
film thickness after 5 cycles55 nmFigure Axis
Approximate
p001 · Supporting Information · Fig. S1a