SEM and AFM
15-cycle Cu3(HHTP)2 film on glass · Thin Film
Top-view SEM and AFM of 15-cycle Cu3(HHTP)2 film on glass and SEM check on Au electrode.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| average surface roughness | 8.54 nm | — | — | Text Exact Reported | p003 / 3424 · Results and discussion · Fig. 2d |
| SEM morphology | continuous and dense film | — | — | Text Qualitative | p002 / 3423 · Results and discussion · Fig. 2c |