Primary studyCore evidenceThermoelectric

Unique Thermoelectric Properties Induced by Intrinsic Nanostructuring in a Polycrystalline Thin-Film Two-Dimensional Metal–Organic Framework, Copper Benzenehexathiol

Tsuchikawa R., Lotfizadeh N., Lahiri N. et al. · Physica Status Solidi (A) Applications and Materials Science · 2020 · 2000437

1materials
18samples
3synthesis routes
23measurements
95results
5claims and caveats

Evidence map

Open a family to keep every result attached to its sample, method and conditions.

Author interpretations and caveats

Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.

Application RelevanceSupport assessment: High

The best estimated ZT of Cu-BHT is only 0.013 at 300 K, but the authors suggest improvement may be possible by tuning charge-carrier density via redox chemistry, chemical doping, or electrical gating.

Caveat: ZT was estimated from combined best values rather than a single optimised sample; Table S1 includes one rounded 2100 S cm-1 conductivity entry, but the authors used sigma = 2000 S cm-1 in the reported ZT estimate.

rendered page 5 / article p.2000437-5 · Results and Discussion · Linked to 3 structured results

Structure Property LinkSupport assessment: High

Cu-BHT has intrinsically small phonon thermal conductivity at room temperature because nanopores and layered structure limit the phonon mean free path.

Caveat: Thermal and electrical conductivity were not measured on the same sample for the thermal-conductivity device; the kappa approximately kappa_p approximation depends on the inferred low sigma of that sample.

rendered page 3 / article p.2000437-3 · Results and Discussion · Figure 2 · Linked to 4 structured results

Transport MechanismSupport assessment: Medium

Percolation through metallic domains connected by less-conductive boundaries is proposed as a possible transport mechanism for Cu-BHT.

Caveat: The paper presents percolation and granular-electronic analogies as plausible explanations; it does not quantitatively fit all data with a single model.

rendered page 4 / article p.2000437-4 · Results and Discussion · Figure 3a-c · Linked to 3 structured results

Transport MechanismSupport assessment: Medium

The low negative Seebeck coefficients indicate electron-majority metallic domains, and the Seebeck voltage is relatively insensitive to polycrystallinity because the temperature gradient is mainly across domains rather than boundaries.

Caveat: The claim is mechanistic and inferred from a small set of Seebeck devices plus UPS support.

rendered page 4 / article p.2000437-4 · Results and Discussion · Figure 3b-c · Linked to 2 structured results

Transport MechanismSupport assessment: Medium

The wide variation in electrical conductivity and its temperature dependence are largely controlled by the extrinsic polycrystalline structure of Cu-BHT films.

Caveat: The authors explicitly state that the origin of Device 4 sublinear behaviour is not clear and that more study is needed to quantify domain connectivity; Table S1 shows large sample-to-sample conductivity variation but does not by itself identify crystallinity.

rendered pages 4-5 / article pp.2000437-4 to 2000437-5 · Results and Discussion; Conclusions · Figure 3a · Linked to 4 structured results

Material identities

Names and aliases are kept exactly within the paper’s own identity model.

MaterialCompositionStructure contextSource
copper benzenehexathiolBrowse family: Cu₃(C₆S₆) / Cu–BHTCu-BHT; unit-cell composition reported as Cu3S6C6Cu, predominantly Cu(I) · benzenehexathiol / benzenehexathiolate (BHT)2D · PristineElectrically conductive 2D MOF with hexagonal crystal structure, nanopores, and layered structure; HR-TEM/FFT show a 0.76 nm lattice spacing/constant in the thin flakes.rendered page 2 / article p.2000437-2 · Characterization and Experiments · Figure 1a-d

Sample register

Sample form, processing state and composition status define the context for measurements.

Show 18 sample records
SampleForm and roleProcessing and geometrySource
exfoliated Cu-BHT thin filmsresearch_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkSynthesised Cu-BHT films exfoliated into thinner films using elastic polymer stamps and transferred onto target substrates.target substrates for device fabrication · 30 to 400 nmrendered page 3 / article p.2000437-3 · Characterization and Experiments · Figure 1e-g
Cu-BHT four-terminal electrical devices 1-4research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated Cu-BHT thin films fabricated into regular four-terminal devices.device substrate with four-terminal electrodes · within 30 to 400 nm; additional non-main-text devices tabulated at 20 to 400 nmrendered pages 3-4 / article pp.2000437-3 to 2000437-4 · Characterization and Experiments; Results and Discussion · Figures 1f and 3a
Cu-BHT Seebeck/electrical devices 5-7research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkThree devices designed with extra leads to generate a temperature gradient and measure both Seebeck coefficient and electrical conductivity on the same Cu-BHT samples.microfabricated device substrate with extra leads for thermal gradient · within 30 to 400 nm; device-specific values not available in local SI textrendered pages 3-4 / article pp.2000437-3 to 2000437-4 · Characterization and Experiments; Results and Discussion · Figures 1g and 3b
synthesised Cu-BHT filmresearch_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkCu-BHT prepared by a literature liquid-liquid interfacial synthesis; sample was kept in air for a long time before device fabrication.rendered pages 2 and 4 / article pp.2000437-2 and 2000437-4 · Characterization and Experiments; Results and Discussion
Chip 10 Dev 1research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 60 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Chip 10 Dev 4research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 60 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Chip 11 Dev 1research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 60 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Chip 11 Dev 2research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 70 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Chip 11 Dev 3research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 70 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Chip 11 Dev 4research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 70 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
P11_T2 Device 7research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 100 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
P11_T2 Device 8research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 70 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
P7_T3_1_C25 Device 2research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 70 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
RT sample 2b spot 2 Dev 1research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 80 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Sample 1 Dev 2research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 20 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Sample 3 Dev 1research_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated pristine Cu-BHT film fabricated into an electrical transport device; dimensions and conductivity tabulated for devices not shown in the main text.microfabricated electrical-transport device substrate · 400 nmrendered SI page 11 · V. Analysis of electrical conductivity · Table S1
Cu-BHT TEM-grid specimenresearch_0173__mat__mat_cu_bhtNanosheet · Target Sample · Pristine FrameworkSuspension of Cu-BHT in ethanol drop-cast onto the TEM grid.lacey carbon/Formvar grid supported by a Cu frameworkSI text p.1 · I. Cu-BHT synthesis and characterization · Figures 1b-d and S3
suspended Cu-BHT thermal-conductivity deviceresearch_0173__mat__mat_cu_bhtThin Film · Target Sample · Pristine FrameworkExfoliated Cu-BHT transferred to undoped Si, patterned by electron-beam lithography, Cr/Cu deposited, then Si dry-etched with XeF2 to suspend the film.undoped silicon substrate; suspended between Cr/Cu heater/sensor leads after XeF2 etch · within 30 to 400 nm; Table S1 reports additional device thicknesses from 20 to 400 nm for devices not shown in the main textSI text p.2 · II.A. Device fabrication · Figure 1e