Microscopy Morphology — Unique Thermoelectric Properties Induced by Intrinsic Nanostructuring in a Polycrystalline Thin-Film Two-Dimensional Metal–Organic Framework, Copper Benzenehexathiol

Measurement evidence

Microscopy Morphology

Unique Thermoelectric Properties Induced by Intrinsic Nanostructuring in a Polycrystalline Thin-Film Two-Dimensional Metal–Organic Framework, Copper Benzenehexathiol · Tsuchikawa R., Lotfizadeh N., Lahiri N. et al. · Physica Status Solidi (A) Applications and Materials Science · 2020 · 2000437

2 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

atomic force microscopy thickness measurement

Atomic force microscopy

exfoliated Cu-BHT thin films · Thin Film

Thickness measured before dry-etch process for device fabrication.

Geometry: exfoliated films on target substrates
Context: pristine Cu-BHT thin films
Measurement source: SI text p.2 · II.A. Device fabrication

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
exfoliated-film thickness range	30 to 400 nm	—	—	Text Range	rendered page 3 / article p.2000437-3 · Characterization and Experiments

HR-TEM, FFT, STEM-EDS and SAED

Transmission electron microscopy Elemental microanalysis and mapping

Cu-BHT TEM-grid specimen · Nanosheet

JEOL-2800; HR-TEM at 80 keV; TEM sample drop-cast from ethanol on lacey carbon/Formvar Cu grid.

Geometry: TEM grid
Context: pristine Cu-BHT
Measurement source: rendered pages 2-3 / article pp.2000437-2 to 2000437-3 · Characterization and Experiments · Figures 1b-d and S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
polycrystalline domain lateral size	sub 10 to 50 nm	—	—	Text Range	rendered page 3 / article p.2000437-3 · Characterization and Experiments · Figure 1c
hexagonal crystal structure	FFT and SAED show hexagonal crystal structure	—	—	Text Qualitative	rendered page 3 / article p.2000437-3 · Characterization and Experiments · Figure 1d and Figure S3
Cu-BHT lattice spacing / lattice constant	0.76 nm	0.76 nm	—	Caption Exact Reported	rendered pages 2-3 / article pp.2000437-2 to 2000437-3 · Characterization and Experiments · Figure 1b-d