Diffraction Structure — Controlling Film Formation and Host-Guest Interactions to Enhance the Thermoelectric Properties of Nickel-Nitrogen-Based 2D Conjugated Coordination Polymers

Measurement evidence

Diffraction Structure

Controlling Film Formation and Host-Guest Interactions to Enhance the Thermoelectric Properties of Nickel-Nitrogen-Based 2D Conjugated Coordination Polymers · Un H.-I., Lu Y., Li J. et al. · Advanced Materials · 2024 · 2312325

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

XRD and GIWAXS

X-ray diffraction and scattering

as-synthesised Ni-HAB film · Thin Film

Diffraction characterisation of Ni-N-based cCP films, including Ni-HAB, Ni-HATP, and Ni-HATI-H.

Temperature: room temperature
Atmosphere: ambient for XRD; helium-filled chamber for GIWAXS
Geometry: films on 1 cm x 1 cm Si wafer without thermal-growth oxide
Context: pristine framework films
Measurement source: p012 · Morphological and structural characterizations · Figure S14

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni-N cCP film broad XRD peak	2theta about 30 deg	—	about	Caption Approximate	p012 · Morphological and structural characterizations · Figure S14