SEM, optical microscopy, and AFM
as-synthesised Ni-HAB film · Thin Film
Film morphology, cracks, powder contaminants, and AFM roughness before/after annealing and for NaOAc vs NH4OH base.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni-HAB NaOAc AFM RMS roughness, 10 um scan | 62.4 | — | — | Figure Axis Exact Reported | p015 · Morphological and structural characterizations · Figure S17c |
| Ni-HAB NH4OH after annealing AFM RMS roughness, 10 um scan | 20.2 | — | — | Figure Axis Exact Reported | p014 · Morphological and structural characterizations · Figure S16c |
| Ni-HAB NH4OH before annealing AFM RMS roughness, 10 um scan | 18.0 | — | — | Figure Axis Exact Reported | p013 · Morphological and structural characterizations · Figure S15c |