Wang R., Yu W., Sun C. et al. · Nanoscale Research Letters · 2022 · 6
Open a family to keep every result attached to its sample, method and conditions.
Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.
Inverted PSCs using 30 nm Ni3(HITP)2 as the dopant-free HTL reached a champion PCE of 10.3% with negligible scan-direction hysteresis.
Caveat: The perovskite deposition recipe is only partially described because it is referred to a previous report.
main p.6 · Results and Discussion · Figure 5b · Linked to 5 structured results
The device EQE remains below 73% across 400-800 nm; the authors suggest inserting Ni3(HITP)2 between the perovskite and top electrode as a future strategy.
main p.7 · Results and Discussion · Figure 5d · Linked to 1 structured result
The interfacially grown film is assigned as Ni3(HITP)2 with XRD peaks consistent with literature, TEM (100) fringe spacing, Ni 2p XPS peaks and no NiO/Ni(OH)2 impurity peaks.
Caveat: Full SI XPS/EDX images are not available in the supplied text layer, but main article text and figures support the assignment.
main p.2 · Results and Discussion · Figure 1 · Linked to 9 structured results
A 30 nm Ni3(HITP)2 film is the optimal HTL thickness in this study because it combines transmittance above 75%, the lowest RMS roughness, strong PL quenching and improved perovskite crystallinity.
Caveat: Exact transmittance curves and full SI AFM/XRD images are not available as data tables in the provided text.
main p.4-6 · Results and Discussion · Figures 2-4 · Linked to 5 structured results
Ni3(HITP)2 is proposed as an effective dopant-free HTL because its high hole mobility, valence-band alignment, PL quenching and shortened TRPL lifetimes support hole extraction from perovskite to the anode.
Caveat: The 48.6 cm2 V-1 s-1 mobility is cited/reported from prior literature rather than measured with a described method in this article.
main p.3 · Results and Discussion · Figure 2 · Linked to 8 structured results
Names and aliases are kept exactly within the paper’s own identity model.
| Material | Composition | Structure context | Source |
|---|---|---|---|
| Ni3(HITP)2 metal-organic frameworkBrowse family: Ni₃(HITP)₂ / Ni–HITP | Ni3(2,3,6,7,10,11-hexaiminotriphenylene)2Nickel nodes in a Ni-HITP conductive framework. · 2,3,6,7,10,11-hexaiminotriphenylene, generated from the hexaaminotriphenylene hexahydrochloride precursor under basic conditions. | 2D · PristineLayered conductive MOF; XRD peaks at 4.7, 9.5, 12.6 and 16.5 degrees are assigned to (100)-family reflections and 27.3 degrees to the (001) reflection. | main p.2 · Results and Discussion · Figure 1a |
| ITO/Ni3(HITP)2/perovskite/PC61BM/Ag inverted perovskite solar cell stackBrowse family: Ni₃(HITP)₂ / Ni–HITP | ITO/Ni3(HITP)2/CH3NH3PbI3/PC61BM/AgNi nodes in the Ni3(HITP)2 HTL component. · HITP linker in Ni3(HITP)2; PC61BM electron-transport layer in the device. | unknown · CompositeApplication device stack containing a pristine Ni3(HITP)2 film as the hole transport layer. | main p.6 · Results and Discussion · Figure 5a |
Sample form, processing state and composition status define the context for measurements.
| Sample | Form and role | Processing and geometry | Source |
|---|---|---|---|
| 20 nm Ni3(HITP)2 filmresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Thickness-controlled air-liquid-interface film transferred onto ITO-coated glass.ITO-coated glass · 20 nm | main p.3-5 · Results and Discussion · Figures 2a, 3, Additional file 1: Figures S5-S8 |
| 30 nm Ni3(HITP)2 filmresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Selected as the optimal HTL thickness for PSC fabrication.ITO-coated glass · 30 nm | main p.6 · Results and Discussion · Figure 5 |
| 40 nm Ni3(HITP)2 filmresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Thickness-controlled air-liquid-interface film transferred onto ITO-coated glass.ITO-coated glass · 40 nm | main p.4-5 · Results and Discussion · Figure 3; Additional file 1: Figure S8 |
| 50 nm Ni3(HITP)2 filmresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Thickness-controlled air-liquid-interface film transferred onto ITO-coated glass.ITO-coated glass · 50 nm | main p.4-5 · Results and Discussion · Figure 3; Additional file 1: Figure S8 |
| Ni3(HITP)2 film on ITO-coated glassresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Floating film formed at an air-liquid interface and transferred to ITO-coated glass by slow lifting.ITO-coated glass · thickness-controllable; specific series includes 20, 30, 40 and 50 nm films | main p.1 · Abstract |
| Ni3(HITP)2 film thickness seriesresearch_0212__mat__mat_ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Reaction time varied to control film thickness.ITO-coated glass · 20 nm, 30 nm, 40 nm and 50 nm | main p.3 · Results and Discussion · Figures 2a, 3 and 4 |
| Perovskite films deposited on Ni3(HITP)2 thickness seriesresearch_0212__mat__mat_ni3_hitp2_psc_stack | Thin Film · Composite Sample · Composite | Perovskite layer deposited by a two-step method on Ni3(HITP)2 films.ITO-coated glass/Ni3(HITP)2 · Ni3(HITP)2 underlayers of 20, 30, 40 and 50 nm; perovskite thickness not specified for this morphology series | main p.4 · Results and Discussion · Figure 4 and Additional file 1: Figure S9 |
| Inverted PSC using 30 nm Ni3(HITP)2 HTLresearch_0212__mat__mat_ni3_hitp2_psc_stack | Electrode · Composite Sample · Composite | ITO/Ni3(HITP)2/perovskite/PC61BM/Ag p-i-n device; effective area 0.0725 cm2.ITO-coated glass · 30 nm Ni3(HITP)2 HTL; about 300 nm perovskite layer | main p.6-7 · Results and Discussion; Device Fabrication · Figure 5a |