X-ray diffraction
Ni3(HITP)2 film on ITO-coated glass · Thin Film
Ni3(HITP)2 film; instrument listed as D8 Advance (Bruker).
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| XRD peak assigned to (001) reflection | 27.3 degrees | — | — | Text Rounded Reported | main p.2 · Results and Discussion · Figure 1a |
| XRD peak assigned to (100)-family reflection | 4.7 degrees | — | — | Text Rounded Reported | main p.2 · Results and Discussion · Figure 1a |
| XRD peak assigned to (100)-family reflection | 9.5 degrees | — | — | Text Rounded Reported | main p.2 · Results and Discussion · Figure 1a |
| XRD peak assigned to (100)-family reflection | 12.6 degrees | — | — | Text Rounded Reported | main p.2 · Results and Discussion · Figure 1a |
| XRD peak assigned to (100)-family reflection | 16.5 degrees | — | — | Text Rounded Reported | main p.2 · Results and Discussion · Figure 1a |