Microscopy Morphology — High-Hole-Mobility Metal–Organic Framework as Dopant-Free Hole Transport Layer for Perovskite Solar Cells

4 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ni3(HITP)2 film thickness series · Thin Film

SEM on Hitachi SU8010; AFM on Bruker; Ni3(HITP)2 thickness series on ITO.

Geometry: thin films on ITO-coated glass
Context: pristine Ni3(HITP)2 films
Measurement source: main p.4-5 · Results and Discussion · Figure 3 and Additional file 1: Figure S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
RMS roughness of 20 nm Ni3(HITP)2 film	9.74 nm	—	—	Text Exact Reported	main p.4 · Results and Discussion · Figure 3f and Additional file 1: Figure S8
RMS roughness of 30 nm Ni3(HITP)2 filmMarked as a best value within this paper	5.5 nm	—	—	Text Exact Reported	main p.4 · Results and Discussion · Figure 3f and Additional file 1: Figure S8
RMS roughness of 40 nm Ni3(HITP)2 film	14.2 nm	—	—	Text Exact Reported	main p.4 · Results and Discussion · Additional file 1: Figure S8
RMS roughness of 50 nm Ni3(HITP)2 film	16.3 nm	—	—	Text Exact Reported	main p.4 · Results and Discussion · Additional file 1: Figure S8

Ni3(HITP)2 film on ITO-coated glass · Thin Film

Elemental mapping of Ni3(HITP)2 membranes/film.

Geometry: thin film
Context: pristine Ni3(HITP)2 film
Measurement source: main p.2 · Results and Discussion · Additional file 1: Figure S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Uniform elemental distribution in Ni3(HITP)2 film	uniform element distribution of Ni, C, and N throughout the whole Ni3(HITP)2 film	—	—	Text Qualitative	main p.2 · Results and Discussion · Additional file 1: Figure S2

Perovskite films deposited on Ni3(HITP)2 thickness series · Thin Film

Perovskite films deposited on Ni3(HITP)2 films of different thicknesses.

Geometry: perovskite thin film on Ni3(HITP)2/ITO
Context: composite perovskite/MOF interface
Measurement source: main p.4-6 · Results and Discussion · Figure 4 and Additional file 1: Figure S9

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Perovskite grain size on 30 nm Ni3(HITP)2Marked as a best value within this paper	increased to 2 um	—	—	Text Rounded Reported	main p.6 · Results and Discussion · Figure 4

Ni3(HITP)2 film on ITO-coated glass · Thin Film

FEI Tecnai F-20, 200 kV.

Geometry: film/nanosheet
Context: pristine Ni3(HITP)2 film
Measurement source: main p.2 and p.7 · Results and Discussion; Characterization · Figure 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
TEM fringe spacing of Ni3(HITP)2	1.884 nm	—	—	Text Exact Reported	main p.2 · Results and Discussion · Figure 1b