Spectroscopy — High-Hole-Mobility Metal–Organic Framework as Dopant-Free Hole Transport Layer for Perovskite Solar Cells

6 measurement groups · 20 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ni3(HITP)2 film thickness series · Thin Film

Films of different thicknesses measured with Shimadzu UV2450 spectrophotometer.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Optical transmittance lower bound for 20 and 30 nm Ni3(HITP)2 films	20 and 30 nm films maintain over 75% transmittance	—	lower bound	Text Approximate	main p.3 · Results and Discussion · Figure 2a
Visual transmittance of 20 nm Ni3(HITP)2 at about 550 nm	about 91% at 550 nm	—	visual estimate from plotted curve	Figure Axis Approximate	main p.4 · Results and Discussion · Figure 2a
Visual transmittance of 30 nm Ni3(HITP)2 at about 550 nm	about 79% at 550 nm	—	visual estimate from plotted curve	Figure Axis Approximate	main p.4 · Results and Discussion · Figure 2a
Visual transmittance of 40 nm Ni3(HITP)2 at about 550 nm	about 64% at 550 nm	—	visual estimate from plotted curve	Figure Axis Approximate	main p.4 · Results and Discussion · Figure 2a
Visual transmittance of 50 nm Ni3(HITP)2 at about 550 nm	about 49% at 550 nm	—	visual estimate from plotted curve	Figure Axis Approximate	main p.4 · Results and Discussion · Figure 2a

Perovskite films deposited on Ni3(HITP)2 thickness series · Thin Film

Perovskite films on ITO with Ni3(HITP)2 HTLs of different thicknesses; excitation wavelength 525 nm.

Geometry: perovskite/HTL thin-film stack
Context: composite perovskite/MOF interface; pristine Ni3(HITP)2 HTL component
Measurement source: main p.3-4 · Results and Discussion · Figure 2d and Additional file 1: Figure S6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Lowest steady-state PL intensity for 30 nm Ni3(HITP)2 HTLMarked as a best value within this paper	30 nm Ni3(HITP)2 film leads to the lowest PL intensity	—	—	Text Qualitative	main p.3 · Results and Discussion · Figure 2d

Inverted PSC using 30 nm Ni3(HITP)2 HTL · Electrode

EQE from 300-800 nm region with corresponding integrated Jsc.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Integrated Jsc from EQE spectrum	16.94 mA cm-2	—	—	Text Exact Reported	main p.7 · Results and Discussion · Figure 5d
Maximum EQE between 400 and 800 nm	no more than 73%	—	upper bound	Text Approximate	main p.7 · Results and Discussion · Figure 5d

Perovskite films deposited on Ni3(HITP)2 thickness series · Thin Film

Perovskite on ITO with different Ni3(HITP)2 thicknesses and PEDOT/PSS comparison.

Geometry: perovskite/HTL thin-film stack
Context: composite perovskite/MOF interface; pristine Ni3(HITP)2 HTL component
Measurement source: SI rendered p.11 · Supporting Information · Figure S7 and Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Average decay lifetime for perovskite on 20 nm Ni3(HITP)2	1.89 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1
Average decay lifetime for perovskite on 30 nm Ni3(HITP)2Marked as a best value within this paper	1.18 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1
Average decay lifetime for perovskite on 40 nm Ni3(HITP)2	2.82 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1
Average decay lifetime for perovskite on 50 nm Ni3(HITP)2	3.02 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1
Average decay lifetime for perovskite/ITO with PEDOT/PSS	6.17 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1
Average decay lifetime for perovskite/ITO without HTL	18.14 ns	—	—	SI Table Exact Reported	SI rendered p.11 · Supporting Information · Table S1

Ni3(HITP)2 film on ITO-coated glass · Thin Film

He(I) source, hv = 21.22 eV; secondary electron cutoff and onset used to calculate Fermi level and valence band maximum.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
UPS secondary electron cutoff	Ecutoff = 16.74 eV	—	—	Figure Axis Exact Reported	main p.4 · Results and Discussion · Figure 2b
Ni3(HITP)2 Fermi level	Ef = 4.48 eV	—	—	Text Exact Reported	main p.3 · Results and Discussion · Figure 2b
UPS onset energy	Eonset = 0.5 eV	—	—	Figure Axis Rounded Reported	main p.4 · Results and Discussion · Figure 2b
Ni3(HITP)2 valence band maximum	VB = 4.98 eV	—	—	Text Exact Reported	main p.3 · Results and Discussion · Figure 2b-c

Ni3(HITP)2 film on ITO-coated glass · Thin Film

Ni 2p spectra; Escalab 250Xi.

Geometry: thin film
Context: pristine Ni3(HITP)2 film
Measurement source: main p.2 · Results and Discussion · Figure 1c and Additional file 1: Figure S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni 2p1/2 XPS peak	873.4 eV	—	—	Text Exact Reported	main p.2 · Results and Discussion · Figure 1c
Ni 2p3/2 XPS peak	855.5 eV	—	—	Text Exact Reported	main p.2 · Results and Discussion · Figure 1c