Diffraction Structure — Anisotropic Redox Conductivity within a Metal-Organic Framework Material

Measurement evidence

Diffraction Structure

Anisotropic Redox Conductivity within a Metal-Organic Framework Material · Goswami S., Hod I., Duan J.D. et al. · Journal of the American Chemical Society · 2019 · 17696-17702

3 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Structural geometry values from NU-1000 crystal structure and channel dimensions

NU-1000 TPPy linker-pair coupling model · Model

Distances and channel sizes used to interpret redox hopping and charge-compensating ion motion.

Atmosphere
not_applicable
Geometry
NU-1000 structural model
Context
model of pristine NU-1000
Measurement source
2 and 4 · Results and Discussion · Figure 1; Figure S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
BARF anion diameter15 AngstromText
Rounded Reported
4 · Results and Discussion
NU-1000 hexagonal channel widthabout 30 AngstromaboutText
Approximate
4 · Results and Discussion
a,b-plane effective hopping distance2.6 nmaboutText
Approximate
8 · Figure S6 discussion · Figure S6
c-direction TPPy hopping distance1.6 nmaboutText
Approximate
2 · Results and Discussion · Figure 1
PF6 anion diameter5 AngstromText
Rounded Reported
4 · Results and Discussion
NU-1000 trigonal channel widthabout 12 AngstromaboutText
Approximate
4 · Results and Discussion

Powder X-ray diffraction in reflection geometry; March-Dollase preferred-orientation analysis.

EPD NU-1000 thin film on ZnO-coated FTO · Electrode

Room-temperature PXRD on EPD film; comparison to simulated NU-1000 pattern.

Temperature
room temperature
Atmosphere
not specified
Geometry
thin film on FTO/ZnO
Context
pristine NU-1000 thin film on electrode substrate
Measurement source
3 · Results and Discussion · Figure S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
NU-1000 (001) PXRD peak positionpeak at 2theta = 5.2 degreesCaption
Rounded Reported
5 · Figure S2 caption · Figure S2
EPD film preferred orientation(001) planes preferentially oriented parallel to the FTO substrate; simulated pattern with r < 1.Text
Qualitative
3 · Results and Discussion · Figure S2

Powder X-ray diffraction in reflection geometry; March-Dollase preferred-orientation analysis.

Solvothermal NU-1000 thin film on ZnO-coated FTO · Electrode

Room-temperature PXRD on as-grown film; Cu X-ray tube at 40 kV and 40 mA; 1.5 to 21 degrees two theta over 30 min.

Temperature
room temperature
Atmosphere
not specified
Geometry
thin film on FTO/ZnO
Context
pristine NU-1000 thin film on electrode substrate
Measurement source
2 · Instrumentation · Figure S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Solvothermal film preferred orientation(001) planes preferentially oriented perpendicular to the FTO substrate; simulated pattern with r > 1.Text
Qualitative
3 · Results and Discussion · Figure S2
PXRD phase match for solvothermal filmObserved PXRD patterns are in accordance with the simulated powder XRD pattern of NU-1000.Text
Qualitative
2 · Results and Discussion · Figure S2