Diffraction Structure — Two-dimensional π-conjugated metal-organic framework with high electrical conductivity for electrochemical sensing

Measurement evidence

Diffraction Structure

Two-dimensional π-conjugated metal-organic framework with high electrical conductivity for electrochemical sensing · Wu F., Fang W., Yang X. et al. · Journal of the Chinese Chemical Society · 2019 · 522-528

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD)

X-ray diffraction and scattering

activated Cu3(HHTP)2 powder · Powder

PXRD collected with Rigaku Ultima IV diffractometer; Figure 1d reports pattern and structural inset.

Geometry: powder diffraction
Context: pristine Cu3(HHTP)2 powder
Measurement source: p002-p003 (journal pp.523-524) · 2.2 Apparatus; 3.1 Characterization · Figure 1d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PXRD axial peak	2theta = 27.3 deg	—	—	Text Rounded Reported	p003 (journal p.524) · 3.1 Characterization · Figure 1d
PXRD in-plane peak 1	2theta = 4.5 deg	—	—	Text Rounded Reported	p003 (journal p.524) · 3.1 Characterization · Figure 1d
PXRD in-plane peak 3	2theta = 16.9 deg	—	—	Text Rounded Reported	p003 (journal p.524) · 3.1 Characterization · Figure 1d
PXRD in-plane peak 2	2theta = 9.2 deg	—	—	Text Rounded Reported	p003 (journal p.524) · 3.1 Characterization · Figure 1d