cMOF Evidence Base
Diffraction Structure — Ultrathin Self-Assembly Two-Dimensional Metal-Organic Framework Films as Hole Transport Layers in Ideal-Bandgap Perovskite Solar Cells

Measurement evidence

Diffraction Structure

Ultrathin Self-Assembly Two-Dimensional Metal-Organic Framework Films as Hole Transport Layers in Ideal-Bandgap Perovskite Solar Cells · Cao J., Liu C.-K., Piradi V. et al. · ACS Energy Letters · 2022 · 3362-3369

2 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

GIXRD / in-plane XRD / HRTEM

X-ray diffraction and scatteringTransmission electron microscopy

ultrathin Cu3(HHTT)2 film on ITO · Thin Film

Out-of-plane and in-plane XRD patterns plus HRTEM of Cu3(HHTT)2 film/grain.

Geometry
thin film / grain
Context
pristine cMOF film
Measurement source
p002-p003 / article p.3363-3364 · Main text · Figure 1b-f
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HRTEM structure assignmenthexagonal crystal structure clearly observed——Text
Qualitative		p003 / article p.3364 · Main text · Figure 1e-f
out-of-plane GIXRD orientationonly c-axis (001) diffraction peak observed——Text
Qualitative		p003 / article p.3364 · Main text · Figure 1c
Cu3(HHTT)2 in-plane (100) peak3.97 deg——Text
Exact Reported		p003 / article p.3364 · Main text · Figure 1d
Cu3(HHTT)2 in-plane (210) peak10.51 deg——Text
Exact Reported		p003 / article p.3364 · Main text · Figure 1d
Cu3(HHTT)2 in-plane (220) peak13.79 deg——Text
Exact Reported		p003 / article p.3364 · Main text · Figure 1d

SEM, XRD, Williamson-Hall analysis and UV-vis/Tauc

UV-visible and optical absorption spectroscopyX-ray diffraction and scatteringScanning electron microscopyHall-effect measurements

FA0.83Cs0.17Sn0.35Pb0.65I2.9Br0.1 perovskite on Cu3(HHTT)2 · Thin Film

Pb-Sn perovskite films on Cu3(HHTT)2 and NiOx HTLs compared under the same processing conditions.

Geometry
perovskite thin films on HTL/ITO
Context
perovskite/MOF composite compared with NiOx control
Measurement source
p004 / article p.3365 · Main text · Figure 2a-c; Figures S4-S5
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
perovskite film bandgap1.33 eV——Text
Exact Reported		p004 / article p.3365 · Main text · Figure S5
perovskite average grain size on Cu3(HHTT)2Marked as a best value within this paper190 nm——Text
Rounded Reported		p004 / article p.3365 · Main text · Figure 2c
perovskite average grain size on NiOx155 nm——Text
Rounded Reported		p004 / article p.3365 · Main text · Figure 2c
perovskite microstrain on Cu3(HHTT)2Marked as a best value within this paper3.28%——Text
Exact Reported		p004 / article p.3365 · Main text · Figure 2c
perovskite microstrain on NiOx5.15%——Text
Exact Reported		p004 / article p.3365 · Main text · Figure 2c