AFM and UV-vis absorption
Cu3(HHTT)2 film on SiO2/Si · Thin Film
AFM roughness and edge-profile thickness of cMOF films; UV-vis absorption of thick cMOF film.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu3(HHTT)2 AFM roughness | 0.28 nm | — | — | Caption Exact Reported | p002 / article p.3363 · Figure caption · Figure 1g |
| Cu3(HHTT)2 optical bandgap | 0.56 eV | — | — | Text Rounded Reported | p004 / article p.3365 · Main text · Figure S2 |
| Cu3(HHTT)2 layer distance | 0.32 nm | — | — | Text Exact Reported | p004 / article p.3365 · Main text · Figure 1g |
| optimum Cu3(HHTT)2 film thicknessMarked as a best value within this paper | ca. 6 nm by text; 6.4 nm in AFM height profile | — | — | Figure Axis Approximate | p009 / SI p.9 · Characterization of MOF and perovskite · Figure S10 |