Diffraction Structure — A semiconducting layered metal-organic framework magnet

Measurement evidence

Diffraction Structure

A semiconducting layered metal-organic framework magnet · Yang C., Dong R., Wang M. et al. · Nature Communications · 2019 · 3260

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD with Cu K-alpha radiation

X-ray diffraction and scattering

as-synthesised K3Fe2[PcFe-O8] dark black powder · Powder

Powder X-ray diffraction compared with calculated stacking patterns.

Geometry: powder
Context: pristine target MOF
Measurement source: p002 · Synthesis and structural analysis · Figure 1b; Supplementary Figures 8-9

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
average crystalline domain size	~36 nm by Scherrer equation	—	~	Text Approximate	p003 · Synthesis and structural analysis
interlayer spacing from (001)Marked as a best value within this paper	3.3 A interval between layers	—	—	Text Rounded Reported	p002 · Synthesis and structural analysis · Figure 1a-b
PXRD (100) peak	2theta = 4.9 deg	—	—	Text Rounded Reported	p002 · Synthesis and structural analysis · Figure 1b
P1 unit-cell a=b	a = b = 18.1 A	—	—	Text Rounded Reported	p002 · Synthesis and structural analysis · Figure 1b