Continuous rotation electron diffraction (cRED)
Ag4TTBQ cRED TEM-grid nanocrystal sample · Single Crystal
TEM JEOL JEM2100 with LaB6 filament and ASI Timepix camera at 200 kV; REDp reconstruction, XRS intensity extraction, SHELXT structure solution.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| cRED unit-cell a | a = 10.340(2) Angstrom | — | (2) | SI Table Exact Reported | SI p.21 · Table S2 · Table S2 |
| cRED unit-cell b | b = 4.1709(8) Angstrom | — | (8) | SI Table Exact Reported | SI p.21 · Table S2 · Table S2 |
| cRED beta angle | beta = 105.16(3) deg | — | (3) | SI Table Exact Reported | SI p.21 · Table S2 · Table S2 |
| cRED unit-cell c | c = 11.940(2) Angstrom | — | (2) | SI Table Exact Reported | SI p.21 · Table S2 · Table S2 |
| cRED space group | I2/m | — | — | SI Table Exact Reported | SI p.21 · Table S2 · Table S2 |
| C=O bond length in Ag4TTBQ | 1.242 Angstrom | — | — | Text Exact Reported | main p.6 · Results and Discussion · Figure 3a |