HR-TEM using JEOL-2010F
Cu3(HHTP)2 crystalline powder · Powder
Transmission electron microscopy at 200 kV.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| (100) lattice fringe distance | 1.81 nm | — | — | Text Exact Reported | 3 · 3.1. Structure and morphology · Fig. 2b |
| layer stacking lattice spacing | 0.37 nm | 3.7 Angstrom | — | Text Exact Reported | 3 · 3.1. Structure and morphology · Fig. 2b |
| nanosheet lateral size | 20-40 nm | — | — | Text Range | 3 · 3.1. Structure and morphology · Fig. 2 |