Grazing incidence X-ray diffraction (GIXD)
Pristine Cu-HHTP thin films for structural and spectroscopic characterisation · Thin Film
SSRL beamline 11-3, incident energy 12.73 keV, sample-detector distance 317.06 mm, incidence angle 0.1 deg, helium chamber.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Broad 002 reflection position | broad diffraction peak around Qz = 2.0 A^-1, indexed as 002 reflection | — | — | Text Approximate | p003 / article p.6334 · MOF Structure Characterization · Figure 2b; Figure S2 |
| Indexed Cu-HHTP in-plane/out-of-plane reflections | (100), (200), and (210) reflections confirm honeycomb Cu-HHTP; broad (002) around Qz = 2.0 A^-1 | — | — | Text Qualitative | p003 / article p.6334 · MOF Structure Characterization · Figure 2b; Figure S2 |