cMOF Evidence Base
Microscopy Morphology — Copper-Based Two-Dimensional Conductive Metal-Organic Framework Thin Films for Ultrasensitive Detection of Perfluoroalkyls in Drinking Water

Measurement evidence

Microscopy Morphology

Copper-Based Two-Dimensional Conductive Metal-Organic Framework Thin Films for Ultrasensitive Detection of Perfluoroalkyls in Drinking Water · Roh H., Quill T.J., Chen G. et al. · ACS Nano · 2025 · 6332-6341

2 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Profilometry and visual inspection of layer-by-layer Cu-HHTP films

Pristine Cu-HHTP thin films for structural and spectroscopic characterisation · Thin Film

Film thickness versus number of growth cycles; SI Figure S1 compares 4L, 6L, 8L, and 10L films.

Geometry
Surface-grown thin films on hydrophilic substrate
Context
pristine Cu-HHTP thin-film growth series
Measurement source
p002 / SI p.2 · Supporting Figure S1 · Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Approximate Cu-HHTP film growth per cycleabout 10 nm per cycle——Text
Approximate		p003 / article p.6334 · Materials Processing and Device Fabrication · Figure 1; Figure S1
Selected sensing-film target thicknessMarked as a best value within this paper100 nm thickness was used as the target thickness in this study.——Caption
Approximate		p005 / SI p.5 · Supporting Figure S6 · Figure S6
Continuous visible film after four cyclesAfter only 4 cycles (2 h), a continuous light-blue film could be observed by naked eye.——Text
Exact Reported		p003 / article p.6334 · Materials Processing and Device Fabrication · Figure S1

SEM and SEM-EDX elemental mapping

Scanning electron microscopyElemental microanalysis and mapping

Pristine Cu-HHTP thin films for structural and spectroscopic characterisation · Thin Film

FEI Magellan 400 XHR SEM with FEG source on films grown on ITO-coated glass or Si; EDX maps for Cu, O, and other elements.

Geometry
2D MOF film on ITO/Si substrate
Context
pristine Cu-HHTP thin film
Measurement source
p003 / article p.6334 · MOF Structure Characterization · Figure 2c,e,f; Figure S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDX elemental uniformityCopper signal and elemental composition from ligand remain uniform across grown film.——Text
Qualitative		p003 / article p.6334 · MOF Structure Characterization · Figure 2e-f; Figure S4
Film morphologyUniformly distributed and interpenetrating MOF crystallites; interconnected crystallites on ITO.——Text
Qualitative		p003 / article p.6334 · MOF Structure Characterization · Figure 2c