Spectroscopy — Copper-Based Two-Dimensional Conductive Metal-Organic Framework Thin Films for Ultrasensitive Detection of Perfluoroalkyls in Drinking Water

3 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Pristine Cu-HHTP thin films for structural and spectroscopic characterisation · Thin Film

Agilent Cary 6000i UV/vis/NIR on Cu-HHTP films grown on cleaned glass substrates.

Geometry: Thin film on glass substrate
Context: pristine Cu-HHTP annealed films
Measurement source: p003 and p007 / article pp.6334 and 6338 · MOF Structure Characterization; Materials and Methods - Morphology Analysis · Figure 2a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Sharp UV-vis absorption peak	sharp peak around 360 nm	—	—	Text Approximate	p003 / article p.6334 · MOF Structure Characterization · Figure 2a
Broad UV-vis absorption peak	broader peak around 650 nm	—	—	Text Approximate	p003 / article p.6334 · MOF Structure Characterization · Figure 2a

Cu-HHTP thin-film device exposed to PFOA · Electrode

Cu, O, C and F XPS spectra for pristine Cu-HHTP, PFOA-exposed and PFOS-exposed films; depth profile using 10 kV Ar+2500 sputtering.

Geometry: Cu-HHTP thin films; 50 nm film for drop-cast PFOA depth profile
Context: PFAS-exposed versus pristine Cu-HHTP
Measurement source: p005-p006 / article pp.6336-6337 · PFAS Sensing Mechanism · Figure 4a-d; Figures S11-S15

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu1+/Cu2+ ratio decreases after PFAS exposure	After PFAS exposure, the relative ratio of Cu1+ to Cu2+ decreased.	—	—	Text Qualitative	p005 / article p.6336 · PFAS Sensing Mechanism · Figure 4a-b; Figure S11
Inherent C-F F 1s binding energy	inherent C-F bond centered around 690 eV	—	—	Text Approximate	p006 / article p.6337 · PFAS Sensing Mechanism · Figure 4d; Figure S15
New metal-F F 1s binding energy	new metal-F coordination around 695 eV	—	—	Text Approximate	p006 / article p.6337 · PFAS Sensing Mechanism · Figure 4d; Figure S15
F 1s peak shift after electrochemical reaction	peak shift of about 5 eV observed across all samples	—	—	Caption Approximate	p010 / SI p.10 · Supporting Figure S15 · Figure S15
PFOA distribution through Cu-HHTP film	PFOA uniformly distributed throughout the bulk of the Cu-HHTP film after exposure.	—	—	Caption Qualitative	p008-p009 / SI pp.8-9 · Supporting Figure S12 · Figure S12
PFOA drop-cast XPS film thickness	10 nM PFOA in water drop-cast onto a 50 nm Cu-HHTP film	—	—	Caption Exact Reported	p008 / SI p.8 · Supporting Figure S12 · Figure S12

Pristine Cu-HHTP thin films for structural and spectroscopic characterisation · Thin Film

PHI Versa Probe 3 XPS, monochromatized Al source 1486.6 eV, 50 W, 200 um spot; calibrated to adventitious carbon 284.8 eV.

Geometry: Surface-grown 2D Cu-HHTP films
Context: pristine Cu-HHTP before PFAS exposure
Measurement source: p003-p004 and p007 / article pp.6334-6335 and 6338 · MOF Structure Characterization; Materials and Methods - Elemental Analysis · Figure 2d; Figure S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu1+ XPS shoulder	shoulder peak around 933 eV assigned to Cu1+	—	—	Text Approximate	p003-p004 / article pp.6334-6335 · MOF Structure Characterization · Figure 2d
Cu2+ XPS peak	strong Cu2+ peak around 935 eV	—	—	Text Approximate	p003-p004 / article pp.6334-6335 · MOF Structure Characterization · Figure 2d
Cu satellite peak	strong satellite peak around 943 eV	—	—	Text Approximate	p003-p004 / article pp.6334-6335 · MOF Structure Characterization · Figure 2d