Diffraction Structure — From insulator to semiconductor: effect of host-guest interactions on charge transport in M-MOF-74 metal-organic frameworks

Measurement evidence

Diffraction Structure

From insulator to semiconductor: effect of host-guest interactions on charge transport in M-MOF-74 metal-organic frameworks · Angel S.M., Barnett N.S., Talin A.A. et al. · Journal of Materials Chemistry C · 2024 · 2699-2704

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (PXRD)

X-ray diffraction and scattering

Cu-MOF-74 powder · Powder

Rigaku SmartLab X-ray diffractometer with HyPix-3000 detector; continuous scan, goniometer in 2theta orientation; typical range 5<2theta<40 deg, 0.01 deg step, 5 deg min-1.

Geometry: Dried ground powder on microscope slide and flat sample stage.
Context: Parent M-MOF-74, TCNQ-loaded analogues, H4TCNQ controls, and pressed pellets.
Measurement source: S-5-S-6 · Characterization methods; Pellet Press & PXRD · Fig. S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Crystallinity retained after TCNQ infiltration	After TCNQ infiltration, the MOFs remained crystalline.	—	—	Text Qualitative	2700 · Results and discussion · Fig. 1; Fig. S2
M-MOF-74 phase identity and isostructural relationship	PXRD confirms M-MOF-74 (M = Cu, Mn, Zn, Mg) powders; patterns are isostructural and differ only by metal ion.	—	—	Text Qualitative	2700 · Results and discussion · Fig. 1a; Fig. S2