Microscopy Morphology

Scanning electron microscopy (SEM)

TCNQ@Cu-MOF-74 pellet · Pellet

JEOL JSM-7600F thermal field emission SEM; samples sputter-coated with gold; 10 kV acceleration voltage, 2000x magnification, 8.0 mm working distance.

Geometry: Solid MOF particles; main Fig. 1 and SI Fig. S3.
Context: Parent, TCNQ-loaded, and H4TCNQ-loaded M-MOF-74 controls.
Measurement source: S-5-S-7 · Characterization methods; SEM Images · Fig. S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Morphology after TCNQ infiltration	MOFs retained rough, porous morphology with some polycrystallinity; SEM showed no metal-containing TCNQ nanowires.	—	—	Text Qualitative	2700 · Results and discussion · Fig. 1b-e

1 measurement group · 1 results