Microscopy Morphology — Redox control and high conductivity of nickel bis(dithiolene) complex π-nanosheet: A potential organic two-dimensional topological insulator

Measurement evidence

Microscopy Morphology

Redox control and high conductivity of nickel bis(dithiolene) complex π-nanosheet: A potential organic two-dimensional topological insulator · Kambe T., Sakamoto R., Kusamoto T. et al. · Journal of the American Chemical Society · 2014 · 14357-14360

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Scanning electron microscopy

ox-1 single microflake van der Pauw sample · Nanosheet

SEM inspection for van der Pauw contact placement and JEOL JSM-7400FNT SEM confirmation of flat and smooth microflake textures.

Temperature: about 300
Geometry: Single microflakes of ox-1 and ap-1; SEM images with 30 um scale bars in main figure and 10 um scale bars in SI.
Context: ox-1 target sample with ap-1 comparison
Measurement source: SI p.S7 · S4 Close-ups of typical SEM images · Figure S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
microflake morphology	flat and smooth textures	—	—	Caption Qualitative	SI p.S7 · S4 Close-ups of typical SEM images · Figure S4