cMOF Evidence Base
Spectroscopy — Redox control and high conductivity of nickel bis(dithiolene) complex π-nanosheet: A potential organic two-dimensional topological insulator

Measurement evidence

Spectroscopy

Redox control and high conductivity of nickel bis(dithiolene) complex π-nanosheet: A potential organic two-dimensional topological insulator · Kambe T., Sakamoto R., Kusamoto T. et al. · Journal of the American Chemical Society · 2014 · 14357-14360

2 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Photoelectron emission spectroscopy

single-layered ap-1 deposited on HOPG for PES · Thin Film

VG-SCIENTA R4000 hemispherical analyser; He I radiation 21.2 eV; base vacuum <5e-11 Torr; EF determined using Fermi edge of electrically connected evaporated Au film.

Temperature
17 and 300
Atmosphere
ultrahigh vacuum
Geometry
Single-layered ap-1 deposited ten times on HOPG.
Context
ap-1 as-prepared sample
Measurement source
SI p.S3 · Photoemission spectroscopy · Figure 4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
ap-1 Fermi edge in PESFermi edge observed at 300 K and more prominent at 17 K——Text
Qualitative		main p.2, article p.14358 · Photoelectron spectroscopy · Figure 4

X-ray photoelectron spectroscopy, S 2s peak deconvolution

X-ray photoelectron spectroscopy

ap-1 as-prepared stacked nickel bis(dithiolene) nanosheets · Nanosheet

PHI 5000 VersaProbe; Al Kalpha source at 15 kV and 25 W; 100 um2 beam; spectra standardised to C(1s) at 284.6 eV.

Temperature
about 300
Geometry
Bulk/stacked nanosheet samples for XPS.
Context
ap-1 as-prepared and chemically oxidised/reduced samples
Measurement source
SI p.S2 · XPS · Figures 2 and S1-S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average nickel bis(dithiolene) oxidation number in ap-1-3/4-0.75 oxidation number—Text
Exact Reported		main p.2, article p.14358 · Redox control and XPS · Figure 2; Figure S1
ap-1 S 2s deconvolution peak for -1 moiety binding energy226.2 eV226.2 eV—SI Table
Exact Reported		SI p.S4 · S1-S3 Deconvolution of the S 2s peak in XPS · Figure S1
ap-1 S 2s deconvolution peak for 0 moiety binding energy227.7 eV227.7 eV—SI Table
Exact Reported		SI p.S4 · S1-S3 Deconvolution of the S 2s peak in XPS · Figure S1
nickel bis(dithiolene) oxidation state in ox-100 oxidation number—Text
Exact Reported		main p.2, article p.14358 · Redox control and XPS · Figure S2
ox-1 S 2s deconvolution peak for 0 moiety binding energy227.6 eV227.6 eV—SI Table
Exact Reported		SI p.S5 · S1-S3 Deconvolution of the S 2s peak in XPS · Figure S2
nickel bis(dithiolene) oxidation state in red-1-1-1 oxidation number—Text
Exact Reported		main p.2, article p.14358 · Redox control and XPS · Figure S3
red-1 S 2s deconvolution peak for -1 moiety binding energy226.2 eV226.2 eV—SI Table
Exact Reported		SI p.S6 · S1-S3 Deconvolution of the S 2s peak in XPS · Figure S3