Powder X-ray diffraction using Cu Kalpha radiation
Na-ZSM-5 (9.8) · Powder
Na-ZSM-5 series; Rigaku D/Max 2550 diffractometer
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
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Diffraction Structure — Zeolites as a Class of Semiconductors for High-Performance Electrically Transduced Sensing
Measurement evidence
Diffraction Structure
Zeolites as a Class of Semiconductors for High-Performance Electrically Transduced Sensing · Wang T., Chu Y., Li X. et al. · Journal of the American Chemical Society · 2023 · 5342-5352
1 measurement group · 0 results
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.