Microscopy Morphology — Zeolites as a Class of Semiconductors for High-Performance Electrically Transduced Sensing

Measurement evidence

Microscopy Morphology

Zeolites as a Class of Semiconductors for High-Performance Electrically Transduced Sensing · Wang T., Chu Y., Li X. et al. · Journal of the American Chemical Society · 2023 · 5342-5352

1 measurement group · 0 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

TEM/HRTEM/SAED/EDS mapping

Transmission electron microscopy Elemental microanalysis and mapping

Na-ZSM-5 (9.8) · Powder

Tecnai F20 TEM at 200 kV; EDS on JEOL JSM-2100F

Atmosphere: vacuum
Context: pristine zeolite powders
Measurement source: 5344 · Results and Discussion - Characterization · Figure 1c-d; Figures S3-S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source