Spectroscopy — Zeolites as a Class of Semiconductors for High-Performance Electrically Transduced Sensing

3 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Na-ZSM-5 (9.8) · Powder

Samples pretreated under vacuum at 500 C; NH3/N2 exposure; spectra 2000-1300 cm^-1

Temperature: 303-773
Atmosphere: vacuum and 100 ppm NH3/N2
Geometry: self-supported wafer in reaction cell with BaF2 window
Context: pristine zeolite powders
Measurement source: 10 · In-situ FTIR spectra measurements · Figures 4d-e; S41-S42

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
FTIR band for ammonium on Bronsted acid sites	1450 cm^-1	—	—	Text Exact Reported	5349 · Electrically Transduced Sensitivity Mechanism · Figure 4d-e
FTIR band for NH3 chemisorbed on Lewis acid sites	1630 cm^-1	—	—	Text Exact Reported	5349 · Electrically Transduced Sensitivity Mechanism · Figure 4d-e

Na-ZSM-5 (9.8) · Powder

Micromeritics AutoChem II 2920 with TCD

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
NH3-TPD acid-strength desorption regions	weak 120-210 C; moderate 220-330 C; strong 350-460 C	—	—	Text Range	5349 · Electrically Transduced Sensitivity Mechanism · Figure 4c

Na-ZSM-5 (9.8) · Powder

Na-ZSM-5 series; direct-band-gap exponent n = 1/2

Atmosphere: ambient
Context: pristine zeolite powders
Measurement source: 5345 · Semiconducting Characteristics Analyses · Figure 1f

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Optical band gap for Na-ZSM-5 (19.5)	4.89 eV	—	—	Text Rounded Reported	5345 · Semiconducting Characteristics Analyses · Figure 1f
Optical band gap for Na-ZSM-5 (29.4)	4.93 eV	—	—	Text Rounded Reported	5345 · Semiconducting Characteristics Analyses · Figure 1f
Optical band gap for Na-ZSM-5 (38.0)	4.97 eV	—	—	Text Rounded Reported	5345 · Semiconducting Characteristics Analyses · Figure 1f
Optical band gap for Na-ZSM-5 (9.8)Marked as a best value within this paper	4.85 eV	—	—	Text Rounded Reported	5345 · Semiconducting Characteristics Analyses · Figure 1f