Microscopy Morphology — Oriented growth of semiconducting TCNQ@Cu3(BTC)2MOF on Cu(OH)2: crystallographic orientation and pattern formation toward semiconducting thin-film devices

3 measurement groups · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Oriented Cu3(BTC)2 photolithographic patterns · Thin Film

Photolithographically patterned film on Si; SEM/photo images and XRD of oriented Cu3(BTC)2 patterns.

Geometry: photomask-derived line patterns on Si wafer
Context: pristine patterned framework
Measurement source: 19616 · 2.2 Oriented Cu3(BTC)2 patterns · Figure 3; Figure S8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Pattern integrity during conversion	No pattern detachment observed	—	—	Text Qualitative	19616 · 2.2 Oriented Cu3(BTC)2 patterns · Figure 3
Possible oriented MOF pattern resolution based on Cu(OH)2 nanobelt width	up to 50 nm possible	5e-8 m	—	Text Approximate	19616 · 2.2 Oriented Cu3(BTC)2 patterns · Figure 3

Three-dimensionally oriented Cu3(BTC)2 thin film · Thin Film

Morphology and thickness of oriented Cu3(BTC)2 thin film on Cu(OH)2 nanobelts.

Context: pristine oriented framework film
Measurement source: 19614 · 2.1 Oriented growth of Cu3(BTC)2 on Cu(OH)2 · Figure 1a,b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(BTC)2 film thickness	~300 nm	3e-7 m	—	Text Approximate	19614 · 2.1 Oriented growth of Cu3(BTC)2 on Cu(OH)2 · Figure 1b

Oriented TCNQ@Cu3(BTC)2 film measured parallel to {111} · Thin Film

Oriented TCNQ@Cu3(BTC)2 thin film with Pt electrodes; surface particulates observed after TCNQ loading.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Particulate crystals after TCNQ introduction	small particulate crystals observed; may be CuTCNQ; discrete and not expected to contribute to conductivity	—	—	Caption Qualitative	10 · Figure S9 caption · Figure S9