Microscopy Morphology — Novel aptasensing strategy for efficiently quantitative analyzing Staphylococcus aureus based on defective copper-based metal–organic framework

4 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM, TEM, HR-TEM, and EDX elemental mapping

Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping

Cu-BDC powder · Powder

SI morphology characterisation of Cu-BDC control; SI S1.5 reports FE-SEM at 15 kV and TEM at 200 kV.

Context: pristine sole-ligand Cu-MOF control powder
Measurement source: SI text · S2. Basic characterizations of Cu-MOFs · Fig. S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-BDC HR-TEM lattice spacing assigned to Cu2O	0.246 nm	0.246 nm	—	Text Exact Reported	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S2e
Cu-BDC nanocube height	1.1 um	1.1 um	—	Text Rounded Reported	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S2
Cu-BDC nanocube side length	5.3 um	5.3 um	—	Text Rounded Reported	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S2

SEM, TEM, HR-TEM, and EDX elemental mapping

Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping

Cu-H3BTC powder · Powder

SI morphology characterisation of Cu-H3BTC control; SI S1.5 reports FE-SEM at 15 kV and TEM at 200 kV.

Context: pristine sole-ligand Cu-MOF control powder
Measurement source: SI text · S2. Basic characterizations of Cu-MOFs · Fig. S3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-H3BTC morphology	octahedral shape with relatively rough surface; loose structure; Cu2O lattice observed	—	—	Text Qualitative	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S3

SEM, TEM, HR-TEM, and EDX elemental mapping

Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping

Cu-H4EBTC powder · Powder

SI morphology characterisation of Cu-H4EBTC control; SI S1.5 reports FE-SEM at 15 kV and TEM at 200 kV.

Context: pristine sole-ligand Cu-MOF control powder
Measurement source: SI text · S2. Basic characterizations of Cu-MOFs · Fig. S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-H4EBTC average cube size	1 um	1 um	—	Text Rounded Reported	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S4
Cu-H4EBTC morphology	irregular cubes with smooth surface; irregular cubes stacked together; Cu2O lattice observed	—	—	Text Qualitative	SI text · S2. Basic characterizations of Cu-MOFs · Fig. S4

FE-SEM, TEM, HR-TEM, SAED, and EDX elemental mapping

Scanning electron microscopy Transmission electron microscopy Elemental microanalysis and mapping

nattier blue ML-Cu2O@Cu-MOF powder · Powder

Morphology and elemental distribution of ML-Cu2O@Cu-MOF nanospheres; ImageJ used for particle-size distribution. SI S1.5 reports FE-SEM at 15 kV and TEM at 200 kV.

Context: target composite MOF powder
Measurement source: p004 / article p.4 · 3.1. Basic characterizations · Fig. 1a-f

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDX mapped elements	uniform distribution of Cu, C, N, and O	—	—	Caption Qualitative	p004 / article p.4 · Figure 1 caption · Fig. 1f
Cu2O lattice spacing in ML-Cu2O@Cu-MOF	0.212 nm, corresponding to Cu2O (200)	0.212 nm	—	Text Exact Reported	p003 / article p.3 · 3.1. Basic characterizations · Fig. 1e
ML-Cu2O@Cu-MOF mean particle size from SEM inset	0.803 +/- 0.153 um	0.803 um	+/- 0.153 um	Figure Axis Approximate	p004 / article p.4 · Figure 1 · Fig. 1a inset
ML-Cu2O@Cu-MOF particle size range	0.3 to 1.1 um	—	—	Text Range	p003 / article p.3 · 3.1. Basic characterizations · Fig. 1a
SAED structure indication	amorphous structure	—	—	Text Qualitative	p003 / article p.3 · 3.1. Basic characterizations · Fig. 1e inset