Electrical Transport — Exceptionally high charge mobility in phthalocyanine-based poly(benzimidazobenzophenanthroline)-ladder-type two-dimensional conjugated polymers

7 measurement groups · 22 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

2DCP-CuPc thin film on fused silica · Thin Film

800 nm/1.55 eV optical excitation; dry N2 transmission geometry; room temperature.

Temperature: 298
Atmosphere: dry N2
Geometry: thin film on fused silica
Context: pristine
Measurement source: 884 · Frequency-resolved THz photoconductivity measurements · Fig. 5a,b; Supplementary Table 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc diffusion length	~157 nm	—	—	Text Approximate	884-885 · Frequency-resolved THz photoconductivity measurements
2DCP-CuPc room-temperature THz charge mobility	460 +/- 31 cm2 V-1 s-1	—	+/- 31 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-CuPc room-temperature Drude scattering time	45 +/- 3 fs	—	+/- 3 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-CuPc powder · Powder

Powder sandwiched between two fused silica substrates to form tens-of-micrometre films.

Temperature: 298
Geometry: powder between fused silica substrates
Context: pristine
Measurement source: S54-S56 · Supplementary Figure 62 · Supplementary Fig. 62; Supplementary Table 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc powder Drude-Smith c parameter	-0.74 +/- 0.02	—	+/- 0.02	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-CuPc powder THz charge mobility	183 +/- 19 cm2 V-1 s-1	—	+/- 19 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-CuPc powder Drude-Smith scattering time	69 +/- 7 fs	—	+/- 7 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-NiPc thin film on fused silica · Thin Film

800 nm/1.55 eV optical excitation; dry N2 transmission geometry; room temperature.

Temperature: 298
Atmosphere: dry N2
Geometry: thin film on fused silica
Context: pristine
Measurement source: 884 · Frequency-resolved THz photoconductivity measurements · Fig. 5a,b; Supplementary Table 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-NiPc diffusion lengthMarked as a best value within this paper	~237 nm	—	—	Text Approximate	884-885 · Frequency-resolved THz photoconductivity measurements
2DCP-NiPc room-temperature THz charge mobilityMarked as a best value within this paper	971 +/- 44 cm2 V-1 s-1	—	+/- 44 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-NiPc room-temperature Drude scattering time	76 +/- 3 fs	—	+/- 3 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-NiPc powder · Powder

Powder sandwiched between two fused silica substrates to form tens-of-micrometre films.

Temperature: 298
Geometry: powder between fused silica substrates
Context: pristine
Measurement source: S54-S56 · Supplementary Figure 62 · Supplementary Fig. 62; Supplementary Table 4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-NiPc powder Drude-Smith c parameter	-0.72 +/- 0.01	—	+/- 0.01	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-NiPc powder THz charge mobility	219 +/- 14 cm2 V-1 s-1	—	+/- 14 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-NiPc powder Drude-Smith scattering time	61 +/- 4 fs	—	+/- 4 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-CuPc thin film on fused silica · Thin Film

Cryostat under vacuum; 298 K to 78 K.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc THz charge mobility at 78 K	706 +/- 37 cm2 V-1 s-1	—	+/- 37 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-CuPc Drude scattering time at 78 K	69 +/- 4 fs	—	+/- 4 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-NiPc thin film on fused silica · Thin Film

Cryostat under vacuum; 298 K to 78 K.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-NiPc THz charge mobility at 78 KMarked as a best value within this paper	1386 +/- 96 cm2 V-1 s-1	—	+/- 96 cm2 V-1 s-1	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4
2DCP-NiPc Drude scattering time at 78 KMarked as a best value within this paper	108 +/- 7 fs	—	+/- 7 fs	SI Table Exact Reported	S62 · Supplementary Table 4 · Supplementary Table 4

2DCP-NiPc thin film on fused silica · Thin Film

1.55 eV pump excitation; photoconductivity decay fitted with two exponential components.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc fast photoconductivity decay component	t1 = 4.5 ps	—	—	SI Table Exact Reported	S61 · Supplementary Table 3 · Supplementary Table 3
2DCP-CuPc slow photoconductivity decay component	t2 = 34.3 ps	—	—	SI Table Exact Reported	S61 · Supplementary Table 3 · Supplementary Table 3
2DCP-CuPc amplitude-weighted photoconductivity lifetime	calculated from A1=14.6, t1=4.5 ps, A2=17.8, t2=34.3 ps	—	—	Calculated From Reported Rounded Reported	S61 · Supplementary Table 3 · Supplementary Table 3
2DCP-NiPc fast photoconductivity decay component	t1 = 4.5 ps	—	—	SI Table Exact Reported	S61 · Supplementary Table 3 · Supplementary Table 3
2DCP-NiPc slow photoconductivity decay component	t2 = 40.5 ps	—	—	SI Table Exact Reported	S61 · Supplementary Table 3 · Supplementary Table 3
2DCP-NiPc amplitude-weighted photoconductivity lifetime	calculated from A1=8.9, t1=4.5 ps, A2=9.0, t2=40.5 ps	—	—	Calculated From Reported Rounded Reported	S61 · Supplementary Table 3 · Supplementary Table 3