Microscopy Morphology — Exceptionally high charge mobility in phthalocyanine-based poly(benzimidazobenzophenanthroline)-ladder-type two-dimensional conjugated polymers

5 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

2DCP-CuPc film on FTO-coated glass · Thin Film

SEM imaging of film on conductive FTO-coated glass substrate.

Context: pristine_control
Measurement source: S46-S48 · Supplementary Figures 53 and 55 · Supplementary Figs. 53 and 55

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc FTO film pinholes by SEM	many pinholes observed; higher defect density than 2DCP-NiPc film	—	—	Qualitative Qualitative	S46-S48 · Supplementary Figures 53 and 55 discussion · Supplementary Figs. 53 and 55

2DCP-CuPc thin film on fused silica · Thin Film

Film thickness and film quality on fused silica/FTO-coated glass.

Context: pristine
Measurement source: S45-S46 · Supplementary Figs. 51-53 · Supplementary Figs. 51-53

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-CuPc film thickness	ca. 800 nm	—	—	Caption Approximate	S45 · Supplementary Figure 51 · Supplementary Fig. 51

2DCP-NiPc film on FTO-coated glass · Thin Film

SEM imaging of film on conductive FTO-coated glass substrate.

Context: pristine_control
Measurement source: S46-S47 · Supplementary Figures 52 and 54 · Supplementary Figs. 52 and 54

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-NiPc FTO film continuity by SEM	continuous film with many big particles on top of the bottom film	—	—	Qualitative Qualitative	S46-S47 · Supplementary Figures 52 and 54 discussion · Supplementary Figs. 52 and 54

2DCP-NiPc thin film on fused silica · Thin Film

Film thickness and film quality on fused silica/FTO-coated glass.

Context: pristine
Measurement source: S45-S46 · Supplementary Figs. 51-53 · Supplementary Figs. 51-53

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-NiPc film thickness	ca. 1200 nm	—	—	Caption Approximate	S45 · Supplementary Figure 51 · Supplementary Fig. 51

2DCP-CuPc powder · Powder

Powder/polycrystal morphology and lattice fringes.

Context: pristine
Measurement source: 881-882 · Synthesis and characterizations of 2DCPs · Supplementary Figs. 32-35

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2DCP-MPc TEM lattice parameter a=b	a = b = ~2.1 nm	—	—	Text Approximate	881-882 · Synthesis and characterizations of 2DCPs · Supplementary Figs. 32-35
2DCP-MPc spherical aggregate diameter	up to ~500 nm	—	—	Text Approximate	881-882 · Synthesis and characterizations of 2DCPs · Supplementary Figs. 32-35