Application RelevanceSupport assessment: Medium
The authors use TGA to argue that both MOF networks have sufficient thermal stability for electrical-device fabrication.
Caveat: TGA values are not a direct operational stability test of the diode devices.
17010-17011 · TGA studies · Fig. 5 · Linked to 4 structured results
Phase AssignmentSupport assessment: Medium
PXRD patterns are used to confirm phase purity of both compounds and active layers before Schottky diode fabrication.
Caveat: The SI provides graphical PXRD comparisons but no numerical phase-fraction analysis.
17006 · Fabrication · ESI Fig. 4 and 5 · Linked to 2 structured results
Structure Property LinkSupport assessment: High
Compound 2 is claimed to perform better than compound 1 because it has higher conductivity, lower series resistance and lower barrier height.
Caveat: Device results are measured on spin-coated Schottky structures rather than free-standing single crystals.
17012-17013 · J-V and impedance analysis · Table 1; Table 2 · Linked to 4 structured results
Structure Property LinkSupport assessment: High
Changing the counter anion from BF4 to SO4 changes the framework: compound 1 has BF4-filled nanotubular pores, whereas compound 2 forms a self-interpenetrated framework with sulfate-water clusters.
17008-17009 · Structural description · Fig. 2; Fig. 3 · Linked to 4 structured results
Transport MechanismSupport assessment: High
The paper claims that anions or anion-water clusters inside cationic, otherwise insulating Zn-MOF frameworks mediate charge transportation.
Caveat: The authors acknowledge possible minor ionic contribution to current and anneal/measure under vacuum and glove-box conditions to minimise solvent/ionic artefacts.
17011 · Analysis of J-V characteristics · Fig. 6 · Linked to 4 structured results