Measurement evidence
Utilization of counter anions for charge transportation in the electrical device fabrication of Zn(ii) metal-organic frameworks · Das K.S., Pal B., Saha S. et al. · Dalton Transactions · 2020 · 17005-17016
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
compound 1 crystals · Single Crystal
SEM image at 120,000x, 5.0 kV, scale bar 100 nm from rendered SI figure.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRSEM morphology | porous/rough nanoscale film-like surface visible; 100 nm scale bar | — | — | Qualitative Qualitative | p009 · HRSEM Images · Fig. SI-6 |
compound 2 crystals · Single Crystal
SEM image at 50,000x, 5.0 kV, scale bar 100 nm from rendered SI figure.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HRSEM morphology | aggregated porous nanoscale deposit visible; 100 nm scale bar | — | — | Qualitative Qualitative | p009 · HRSEM Images · Fig. SI-7 |