two-terminal current-voltage sweep with microprobes
Cu(TCNQ) film from 50-cycle Cu3BTC2 device · Electrode
Voltage swept between -1 and 1 V under ambient conditions; current measured with DL 1211 current preamplifier.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Conductivity increase after conversionMarked as a best value within this paper | increased by 10 orders of magnitude | — | — | Text Rounded Reported | p006 / 39405 · Electrical Conductivity Change · Figure 8 |
| Converted Cu(TCNQ) current at +1 V | approximately +56 uA at +1 V from Figure 8 axis | 0.000056 A | visual estimate from plotted line | Figure Axis Approximate | p006 / 39405 · Figure · Figure 8 |
| Converted Cu(TCNQ) film conductivityMarked as a best value within this paper | on the order of 10^-1 S/cm | 10 S/m | order-of-magnitude | Text Approximate | p006 / 39405 · Electrical Conductivity Change · Figure 8 |
| Assumed film thickness for conductivity calculation | 100 nm | 1e-7 m | assumed average | Caption Rounded Reported | p006 / 39405 · Figure caption · Figure 8 |
| Au pad spacing for electrical measurement | 50 um apart | 0.00005 m | — | Caption Exact Reported | p006 / 39405 · Figure caption · Figure 8 |
| Au pad width for electrical measurement | 500 um wide Au pads | 0.0005 m | — | Caption Exact Reported | p006 / 39405 · Figure caption · Figure 8 |
| Literature Cu(TCNQ) conductivity comparison | 0.25 S/cm | 25 S/m | — | Text Exact Reported | p006 / 39405 · Electrical Conductivity Change |
| Pristine Cu3BTC2 film conductivity | <10^-11 S/cm | 1e-9 S/m | less than | Text Rounded Reported | p006 / 39405 · Electrical Conductivity Change · Figure 8 |
| Previously reported TCNQ-infiltrated Cu3BTC2 carrier type context | p-type by Seebeck coefficient measurements | — | no numeric Seebeck value reported in this paper | Text Qualitative | p009 / 39408 · Conclusions |