Microscopy Morphology — Surface Morphology and Electrical Properties of Cu3BTC2 Thin Films before and after Reaction with TCNQ

5 measurement groups · 21 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

20-cycle Cu3BTC2 film on ITO · Thin Film

Particle-number and film-volume histograms from AFM data in Figure 1d; masks shown in SI Figure S5.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Particle-number versus volume-fraction peak separation	almost 3 orders of magnitude apart	—	almost	Text Approximate	p004 / 39403 · Results and Discussion · Figure 3
20-cycle large crystallite height	100-200 nm tall	—	100-200 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 3
20-cycle large crystallite width	200-400 nm wide	—	200-400 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 3
20-cycle majority crystallite height	10-20 nm tall	—	10-20 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 3
20-cycle majority crystallite width	20-50 nm wide	—	20-50 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 3

20-cycle Cu3BTC2 film on ITO · Thin Film

Ex situ AFM after 0.5, 2, 7, and 20 deposition cycles on ITO; 1280 x 1280 pixel images typical.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
2-cycle Cu3BTC2 cluster height range	10-40 nm tall	—	10-40 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 1b
2-cycle Cu3BTC2 cluster width range	40-120 nm wide	—	40-120 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 1b
0.5-cycle precursor substrate coverage	approximately 0.1% of the substrate	—	approximate	Text Approximate	p004 / 39403 · Results and Discussion · Figure 1a
0.5-cycle precursor particle size	approximately 5 nm-sized particles	—	approximate	Text Approximate	p004 / 39403 · Results and Discussion · Figure 1a
ITO substrate rms roughness	approximately 1 nm	—	approximate	Text Approximate	p002 / 39401 · Experimental Section

4-cycle Cu3BTC2 film on amorphous SiO2/Si(001) · Thin Film

4-cycle Cu3BTC2 films grown on polycrystalline ITO and amorphous SiO2/Si(001); particle-number and volume-fraction histograms compared.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM mask image size for particle analysis	5 um x 5 um	25 um^2 image area	—	Caption Exact Reported	p005 / S-5 · Figure caption · Figure S5
4-cycle Cu3BTC2/ITO histogram peak offset	about 3 orders of magnitude apart	—	about	Caption Approximate	p009 / 39408 · Figure caption · Figure 10
4-cycle Cu3BTC2/SiO2 histogram peak offset	factor of 4	—	—	Caption Exact Reported	p009 / 39408 · Figure caption · Figure 10

Cu(TCNQ) film from 20-cycle Cu3BTC2 on ITO · Thin Film

0.5-, 2-, and 20-cycle films imaged after immersion in TCNQ/MeOH.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
TCNQ-treated 0.5-cycle cluster height	10-30 nm-tall clusters	—	10-30 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 4a
TCNQ-treated 0.5-cycle depression depth	approximately 10 nm deep	—	approximate	Text Approximate	p004 / 39403 · Results and Discussion · Figure 4a
TCNQ-treated 0.5-cycle depression width	100-500 nm-wide depressions	—	100-500 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 4a
TCNQ-treated 20-cycle platelet diameter	200-300 nm diameter	—	200-300 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 4c
TCNQ-treated 2-cycle cluster height	20-50 nm tall	—	20-50 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 4b
TCNQ-treated 2-cycle cluster width	30-150 nm wide	—	30-150 nm	Text Range	p004 / 39403 · Results and Discussion · Figure 4b

Cu(TCNQ) film from 50-cycle Cu3BTC2 device · Electrode

FEI XL30s SEM at 5 kV; samples coated with 3 nm AuPd for image quality and charging reduction.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
50-cycle SiO2/Si pristine SEM size distribution	large size distribution with many small and few large crystallites	—	—	Caption Qualitative	p002 / S-2 · Figure caption · Figure S2
50-cycle SiO2/Si SEM morphology after TCNQ	conversion evidenced by morphology change	—	—	Caption Qualitative	p003 / S-3 · Figure caption · Figure S3