Diffraction Structure — Thin film thermoelectric metal-organic framework with high seebeck coefficient and low thermal conductivity

Measurement evidence

Diffraction Structure

Thin film thermoelectric metal-organic framework with high seebeck coefficient and low thermal conductivity · Erickson K.J., Leonard F., Stavila V. et al. · Advanced Materials · 2015 · 3453-3459

1 measurement group · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Grazing-incidence X-ray diffraction and scanning electron microscopy

X-ray diffraction and scattering Scanning electron microscopy

Pristine Cu3(BTC)2 thin-film device on quartz · Thin Film

Cu3(BTC)2 thin films before/after TCNQ infiltration; supporting XRD plotted for HKUST-1 before and after infiltration.

Geometry: Thin film on quartz substrate
Context: Pristine Cu3(BTC)2 control and infiltrated film comparison
Measurement source: main p.6, article p.3458 · Growth and Characterization of MOF Thin Films · Figure S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu3(BTC)2 nominal film thickness	200 nm nominal thickness	—	—	Text Rounded Reported	main p.6, article p.3458 · Experimental Section
Grain size range	tens of nanometers to about 1 um depending on film thickness and exact growth conditions	—	—	Text Range	main p.2, article p.3454 · Results · Figure 1a
Preferred orientation	polycrystalline with preferred orientation along the (111) direction	—	—	Text Qualitative	main p.6, article p.3458 · Experimental Section · Figure S1