TEM, TEM mapping and XPS
POMOF-functionalised perovskite film · Thin Film
Control and POMOF-functionalised perovskite films compared for lattice spacing, elemental mapping, and defect-related XPS peaks.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| perovskite lattice distance, control | 2.92 angstrom | — | — | Text Exact Reported | p003 · 2.2 Defect Elimination Ability · Figure 2a,b |
| perovskite lattice distance, POMOF film | 2.98 angstrom | — | — | Text Exact Reported | p003 · 2.2 Defect Elimination Ability · Figure 2a,b |
| metallic Pb0 XPS peaks | Pb0 peaks at 141.0 and 136.1 eV almost disappeared after POMOF introduction | — | — | Text Qualitative | p003 · 2.2 Defect Elimination Ability · Figure 2d |