Diffraction Structure — Semiconducting to Metallic Electronic Landscapes in Defects-Controlled 2D π-d Conjugated Coordination Polymer Thin Films

6 measurement groups · 13 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

2D GIWAXS on Cu-BHT grown atop glass substrate; azimuthal integration used for mosaicity factor

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIWAXS qxy reflection for (100), S-V CVD	qxy = 0.74 A-1	—	—	Text Exact Reported	6 · Results and Discussion · Figure 4B
mosaicity factor MF(001);0 deg, S-V CVDMarked as a best value within this paper	MF(001);0 deg = 0.71	—	—	Text Exact Reported	6 · Results and Discussion · Figure 4C
GIWAXS crystallite orientation, S-V CVD	mostly face-on and a small amount edge-on	—	—	Text Qualitative	6 · Results and Discussion · Figure 4D

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

2D GIWAXS on Cu-BHT grown atop glass substrate; azimuthal integration used for mosaicity factor

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIWAXS qxy reflection for (100), V-V CVD	qxy = 0.74 A-1	—	—	Text Exact Reported	5 · Results and Discussion · Figure 4A
GIWAXS qz reflection for (001), V-V CVD	qz = 1.96 A-1	—	—	Text Exact Reported	5 · Results and Discussion · Figure 4A
mosaicity factor MF(001);0 deg, V-V CVD	MF(001);0 deg = 0.54	—	—	Text Exact Reported	6 · Results and Discussion · Figure 4C
GIWAXS crystallite orientation, V-V CVD	exclusively face-on with respect to the substrate	—	—	Text Qualitative	6 · Results and Discussion · Figure 4D

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

SI line scan in q space and 2theta for S-V CVD Cu-BHT

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIXRD prominent (001), S-V CVD	prominent (001) crystallographic plane	—	—	Qualitative Qualitative	6 · Results and Discussion · Figure S4B

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

SI line scan in q space and 2theta for V-V CVD Cu-BHT

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIXRD prominent (001), V-V CVD	prominent (001) crystallographic plane	—	—	Qualitative Qualitative	6 · Results and Discussion · Figure S4A

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

HRTEM/FFT used to assign hexagonal structure and slipped AB stacking

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HRTEM fringe spacing, S-V CVD	3.72 A	—	—	Text Exact Reported	5 · Results and Discussion · Figure 3B
stacking assignment, S-V CVD	slipped AB stacking pattern	—	—	Text Qualitative	5 · Results and Discussion · Figure 3C,D

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

HRTEM acquired along [001] rotation axis; plate-like sheets and FFT used to assign lattice spacing and stacking

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HRTEM fringe spacing, V-V CVD	7.36 A	—	—	Text Exact Reported	4 · Results and Discussion · Figure 3A
stacking assignment, V-V CVD	non-slipped AA stacking pattern	—	—	Text Qualitative	5 · Results and Discussion · Figure 3C,D