Spectroscopy — Semiconducting to Metallic Electronic Landscapes in Defects-Controlled 2D π-d Conjugated Coordination Polymer Thin Films

7 measurement groups · 18 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

NIST beamline 7-ID-1 at NSLS-II; angles 20 deg, 54.7 deg, and 90 deg; used to assess electronic structure and alignment

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
NEXAFS dichroic ratio, S-V CVDMarked as a best value within this paper	-0.60 +/- 0.05	—	+/- 0.05	Text Exact Reported	8 · Results and Discussion · Figure 6B
*NEXAFS extra pi resonance associated with fewer defects, S-V CVD**	286.1 eV	—	—	Text Exact Reported	8 · Results and Discussion · Figure 6B

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

NIST beamline 7-ID-1 at NSLS-II; angles 20 deg, 54.7 deg, and 90 deg; used to assess electronic structure and alignment

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
NEXAFS dichroic ratio, V-V CVD	-0.010 +/- 0.005	—	+/- 0.005	Text Exact Reported	8 · Results and Discussion · Figure 6A
NEXAFS broad sigma transition energy, V-V CVD	302 eV	—	—	Text Rounded Reported	8 · Results and Discussion · Figure 6A
*NEXAFS pi resonance energy, V-V CVD**	285.2 eV	—	—	Text Exact Reported	8 · Results and Discussion · Figure 6A
*NEXAFS sigmaC-C resonance energy, V-V CVD**	294 eV	—	—	Text Rounded Reported	8 · Results and Discussion · Figure 6A
*NEXAFS sigmaC-S resonance energy, V-V CVD**	288.7 eV	—	—	Text Exact Reported	8 · Results and Discussion · Figure 6A

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

Cu oxidation-state assessment; normal takeoff angle; CasaXPS fitting

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu oxidation-state assignment, S-V CVD	Cu(I)	—	—	Text Qualitative	6 · Results and Discussion · Figure S5C

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

Cu oxidation-state assessment; normal takeoff angle; CasaXPS fitting

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu 2p1/2 binding energy, V-V CVD	952.8 eV	—	—	Text Exact Reported	6 · Results and Discussion · Figure S5
Cu 2p3/2 binding energy, V-V CVD	932.9 eV	—	—	Text Exact Reported	6 · Results and Discussion · Figure S5
Cu 2p spin-orbit splitting, V-V CVD	19.9 eV	—	—	Text Exact Reported	6 · Results and Discussion · Figure S5
Cu oxidation-state assignment, V-V CVD	Cu(I)	—	—	Text Qualitative	6 · Results and Discussion · Figure S5B

Cu-BHT prepared using liquid-liquid polymerization growth · Thin Film

S-Cu and S-C bonding environment ratio for liquid-liquid Cu-BHT comparator

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S-Cu:S-C coordination ratio, liquid-liquid comparator	1.2:1	—	—	Caption Exact Reported	7 · Results and Discussion · Figure 5B

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

S-Cu and S-C bonding environment ratio for S-V CVD Cu-BHT

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S-Cu:S-C coordination ratio, S-V CVDMarked as a best value within this paper	2.1:1	—	—	Caption Exact Reported	7 · Results and Discussion · Figure 5D

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

S-Cu and S-C bonding environment ratio for V-V CVD Cu-BHT

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
S 2p1/2 binding energy	about 162.4 eV	—	—	Text Approximate	6 · Results and Discussion · Figure 5
S 2p3/2 binding energy	about 165.6 eV	—	—	Text Approximate	6 · Results and Discussion · Figure 5
S 2p spin-orbit splitting	1.2 eV	—	—	Text Exact Reported	6 · Results and Discussion · Figure 5
S-Cu:S-C coordination ratio, V-V CVD	1.1:1	—	—	Caption Exact Reported	7 · Results and Discussion · Figure 5C