Electrical Transport — Semiconducting to Metallic Electronic Landscapes in Defects-Controlled 2D π-d Conjugated Coordination Polymer Thin Films

Measurement evidence

Electrical Transport

Semiconducting to Metallic Electronic Landscapes in Defects-Controlled 2D π-d Conjugated Coordination Polymer Thin Films · Ogle J., Lahiri N., Jaye C. et al. · Advanced Functional Materials · 2021 · 2006920

2 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ecopia 7000 Photonic Hall measurement system, van der Pauw configuration

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

Temperature-dependent electrical conductivity of S-V CVD Cu-BHT thin film; uncertainty from standard deviation of three data sets

Temperature
temperature sweep approximately 80-330 K from Figure 7A
Geometry
van der Pauw
Context
pristine framework thin film
Measurement source
9 · Results and Discussion · Figure 7A,C
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
room-temperature electrical conductivity, S-V CVDMarked as a best value within this paper1440 +/- 5 S cm-1+/- 5 S cm^-1Text
Exact Reported
9 · Results and Discussion · Figure 7A
electrical conductivity near low-temperature end, S-V CVDMarked as a best value within this paperapproximately 2100 S cm-1 near 90 K from Figure 7A axisvisual estimate from plotted pointsFigure Axis
Approximate
9 · Results and Discussion · Figure 7A
transport model fit, S-V CVDMarked as a best value within this paperdescribed by a 1/T model; not thermally activatedText
Qualitative
9 · Results and Discussion · Figure 7C
temperature trend of conductivity, S-V CVDMarked as a best value within this paperconductivity decreases gradually with increasing temperature; metallicText
Qualitative
9 · Results and Discussion · Figure 7A,C

Ecopia 7000 Photonic Hall measurement system, van der Pauw configuration

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

Temperature-dependent electrical conductivity of V-V CVD Cu-BHT thin film; uncertainty from standard deviation of three data sets

Temperature
temperature sweep approximately 80-330 K from Figure 7A
Geometry
van der Pauw
Context
pristine framework thin film
Measurement source
9 · Results and Discussion · Figure 7A,B
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
activation energy from Arrhenius relation, V-V CVD0.15 meVText
Exact Reported
9 · Results and Discussion · Figure 7B
room-temperature electrical conductivity, V-V CVD960 +/- 5 S cm-1+/- 5 S cm^-1Text
Exact Reported
9 · Results and Discussion · Figure 7A
electrical conductivity near low-temperature end, V-V CVDapproximately 720 S cm-1 near 80-90 K from Figure 7A axisvisual estimate from plotted pointsFigure Axis
Approximate
9 · Results and Discussion · Figure 7A
temperature trend of conductivity, V-V CVDconductivity increases gradually with increasing temperature; semiconductingText
Qualitative
9 · Results and Discussion · Figure 7A,B
transport model fit, V-V CVDlog sigma versus 1/T^(1/4) follows a straight lineText
Qualitative
9 · Results and Discussion · Figure 7B