Microscopy Morphology — Semiconducting to Metallic Electronic Landscapes in Defects-Controlled 2D π-d Conjugated Coordination Polymer Thin Films

4 measurement groups · 10 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

Morphology, roughness, and domain-size assessment for S-V CVD Cu-BHT thin film

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
large-area continuous film size, S-V CVD	1 inch x 1 inch	—	—	Text Exact Reported	4 · Results and Discussion · Figure 2B
AFM crystal domain size range, S-V CVD	about 25 to 50 nm	—	range upper bound 50 nm	Text Range	4 · Results and Discussion · Figure 2D
AFM RMS roughness rq, S-V CVDMarked as a best value within this paper	rq = 4.2 nm	—	—	Text Rounded Reported	4 · Results and Discussion · Figure 2D

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

SI Figure S1 compares V-V thicknesses for films reacted two hours and six hours

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM thickness example, V-V CVD 2 h	19 nm label for V-V film reacted two hours across a 3-inch area	—	—	Visual Estimate Rounded Reported	3 · Supporting Information · Figure S1A
AFM thickness example, V-V CVD 6 h	52 nm label for V-V film reacted six hours across a 3.5-inch area	—	—	Visual Estimate Rounded Reported	3 · Supporting Information · Figure S1B

Cu-BHT thin film from solid-vapor interfacial CVD polymerization growth · Thin Film

SI Figure S1 compares S-V thicknesses for Cu(II) precursor films spin-cast at 6000 RPM and 2000 RPM

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM thickness example, S-V CVD 2000 rpm precursor coating	41 nm label for S-V precursor spun-cast at 2000 RPM	—	—	Visual Estimate Rounded Reported	3 · Supporting Information · Figure S1D
AFM thickness example, S-V CVD 6000 rpm precursor coating	15 nm label for S-V precursor spun-cast at 6000 RPM	—	—	Visual Estimate Rounded Reported	3 · Supporting Information · Figure S1C

Cu-BHT thin film from vapor-vapor interfacial CVD polymerization growth · Thin Film

Morphology, roughness, and domain-size assessment for V-V CVD Cu-BHT thin film

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
large-area continuous film size, V-V CVD	1 inch x 1 inch	—	—	Text Exact Reported	4 · Results and Discussion · Figure 2A
AFM crystal domain size range, V-V CVDMarked as a best value within this paper	about 60 to 100 nm	—	range upper bound 100 nm	Text Range	4 · Results and Discussion · Figure 2C
AFM RMS roughness rq, V-V CVD	rq = 17 nm	—	—	Text Rounded Reported	4 · Results and Discussion · Figure 2C