| Ni3(HITP)2-205 nm/Au/SiO2/Si two-probe filmresearch_0502__mat__ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Transferred onto Au/SiO2/Si for two-probe I-V conductivity measurement.Au electrodes on SiO2/Si wafer · 205 nm | p006 · Experimental Section 4.5 · Scheme S3 |
| Ni3(HITP)2-205 nm/FTO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Target Sample · Pristine Framework | Liquid-air-interface film transferred to FTO by Langmuir-Schaefer method; rinsed and vacuum dried.FTO glass · 205 nm | p005 · Experimental Section 4.2-4.3 |
| Ni3(HITP)2-290 nm/Au/SiO2/Si two-probe filmresearch_0502__mat__ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Transferred onto Au/SiO2/Si for two-probe I-V conductivity measurement.Au electrodes on SiO2/Si wafer · 290 nm | S-18 / p018 · Supporting Table S2 · Table S2 |
| Ni3(HITP)2-290 nm/FTO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Target Sample · Pristine Framework | Liquid-air-interface film transferred to FTO by Langmuir-Schaefer method; used for electrochromic cycling and FTO/ITO comparison.FTO glass · 290 nm | S-18 / p018 · Supporting Tables S2 and S4 · Tables S2 and S4 |
| Ni3(HITP)2-290 nm/ITO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Pristine Control · Pristine Framework | Same film deposited on ITO glass for substrate comparison.ITO glass · 290 nm | S-16 / p016 · Supporting Figure S15 · Figure S15 and Table S4 |
| Ni3(HITP)2-362 nm/Au/SiO2/Si two-probe filmresearch_0502__mat__ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Transferred onto Au/SiO2/Si for two-probe I-V conductivity measurement.Au electrodes on SiO2/Si wafer · 362 nm | S-18 / p018 · Supporting Table S2 · Table S2 |
| Ni3(HITP)2-362 nm/FTO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Target Sample · Pristine Framework | Liquid-air-interface film transferred to FTO by Langmuir-Schaefer method.FTO glass · 362 nm | p003 · Results and Discussion · Figure 2a |
| Ni3(HITP)2-435 nm/Au/SiO2/Si two-probe filmresearch_0502__mat__ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Transferred onto Au/SiO2/Si for two-probe I-V conductivity measurement.Au electrodes on SiO2/Si wafer · 435 nm | S-18 / p018 · Supporting Table S2 · Table S2 |
| Ni3(HITP)2-435 nm/FTO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Target Sample · Pristine Framework | Liquid-air-interface film transferred to FTO by Langmuir-Schaefer method.FTO glass · 435 nm | p005 · Results and Discussion · Figure 4c-d |
| Ni3(HITP)2-435 nm light-modulation filter deviceresearch_0502__mat__ni3_hitp2 | Electrode · Composite Sample · Composite | Electrochromic filter/lens demonstration for camera light modulation.FTO-based electrochromic device · 435 nm active film | p005 · Results and Discussion · Figure 4c-d |
| Ni3(HITP)2-524 nm/Au/SiO2/Si two-probe filmresearch_0502__mat__ni3_hitp2 | Thin Film · Target Sample · Pristine Framework | Transferred onto Au/SiO2/Si for two-probe I-V conductivity measurement.Au electrodes on SiO2/Si wafer · 524 nm | S-18 / p018 · Supporting Table S2 · Table S2 |
| Ni3(HITP)2-524 nm number 8 electrochromic deviceresearch_0502__mat__ni3_hitp2 | Electrode · Composite Sample · Composite | Sandwich electrochromic device with 1 M LiClO4/PC electrolyte and UV-curing glue seal.FTO glass / Ni3(HITP)2 electrode / FTO counter electrode · 524 nm active film; Scotch tape spacer thickness 0.3 cm | p005 · Experimental Section 4.4 · Figure 4a-b, Scheme S4 |
| Ni3(HITP)2-524 nm/FTO electroderesearch_0502__mat__ni3_hitp2 | Electrode · Target Sample · Pristine Framework | Liquid-air-interface film transferred to FTO by Langmuir-Schaefer method.FTO glass · 524 nm | p005 · Results and Discussion · Figure 4a-b |
| Ni3(HITP)2 precipitate/powderresearch_0502__mat__ni3_hitp2 | Powder · Target Sample · Pristine Framework | Produced from the interfacial reaction and used for PXRD, TEM, N2 sorption, XPS, FTIR, and Raman characterisation. | p002 · Results and Discussion · Figure 1 |