SEM and cross-section SEM
Ni3(HITP)2-362 nm/FTO electrode · Electrode
Field-emission SEM (Hitachi S-4800) used to inspect surface uniformity and cross-section thickness for the film series.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Film thickness, Ni3(HITP)2-205 | 205 nm | — | — | SI Table Exact Reported | S-18 / p018 · Supporting Table S2 · Table S2 |
| Film thickness, Ni3(HITP)2-290 | 290 nm | — | — | SI Table Exact Reported | S-18 / p018 · Supporting Table S2 · Table S2 |
| Film thickness, Ni3(HITP)2-362 | 362 nm | — | — | SI Table Exact Reported | S-18 / p018 · Supporting Table S2 · Table S2 |
| Film thickness, Ni3(HITP)2-435 | 435 nm | — | — | SI Table Exact Reported | S-18 / p018 · Supporting Table S2 · Table S2 |
| Film thickness, Ni3(HITP)2-524 | 524 nm | — | — | SI Table Exact Reported | S-18 / p018 · Supporting Table S2 · Table S2 |