| electrochemical and Pt-only controlsresearch_0504__mat__mat_controls | Electrode · Model System · Model | used for CV, Pt-only resistance and gas-sensing controlsGCE, Pt, Au, Pd-decorated ITO, Pt on glass/silicon · Pt pre-set 0.3 nm; identified 0.24 nm for sputtered 0.3 nm layer | 3-4 · CV measurements; Table S1 · Table S1; Figure S32; Figure S37 |
| Cu2TBA film, 60 minresearch_0504__mat__mat_cu2tba | Thin Film · Target Sample · Pristine Framework | room-temperature catalysis-assisted immersion, 60 min0.3 nm Pt-coated substrate · not text-reported | 17 · Supplementary data · Figure S14 |
| edge-on Cu3(HHTP)2 film from air-saturated precursorresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | air-saturated precursor; slower reaction kinetics0.3 nm Pt-coated substrate · nanosheets ~35 nm thick; growth series to ~2000 nm after 24 h by Figure S25 | 17062 · Results and Discussion · Figure 7; Figure S25 |
| ~80 nm edge-on Cu3(HHTP)2 NH3 sensorresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | air-saturated device recipe for 20 min; Au electrodes deposited after growthparylene/SiO2/Si with Au interdigitated electrodes · ~80 nm | 36 · Gas Sensing · Figure S33-S34 |
| 220 nm edge-on Cu3(HHTP)2 four-probe filmresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | Four Au contacts; I-V at different temperatures under ~1e-5 mbarglass with 0.3 nm Pt; Au contacts · 220 nm | 34 · Conductivity Measurement · Figure S31-S32 |
| face-on Cu3(HHTP)2 film on silicon, 60 minresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | O2-saturated precursor, 60 min room-temperature immersion; rinsed with DMF and methanol; N2 dry0.3 nm Pt-coated silicon · ~1720 nm | 17059-17060 · Results and Discussion · Figure 2 |
| face-on Cu3(HHTP)2 growth-series filmsresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | O2-saturated precursor, varied 1 min to 4 h0.3 nm Pt-coated substrates · ~190 nm at 1 min to 2460 nm at 120 min; 4 h bilayer bottom ~3500 nm plus top ~540 nm | 17061-17062 · Results and Discussion · Figure 6; Figures S23-S24 |
| ~70 nm face-on Cu3(HHTP)2 NH3 sensorresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | O2-saturated device recipe for 40 s; Au electrodes deposited after growthparylene/SiO2/Si with Au interdigitated electrodes · ~70 nm | 36 · Gas Sensing · Figure S33-S34 |
| 260 nm face-on Cu3(HHTP)2 four-probe filmresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | Four Au contacts; I-V at different temperatures under ~1e-5 mbarglass with 0.3 nm Pt; Au contacts · 260 nm | 34 · Conductivity Measurement · Figure S31-S32 |
| patterned Cu3(HHTP)2 films on varied substratesresearch_0504__mat__mat_cu_hhtp | Thin Film · Target Sample · Pristine Framework | mask-patterned Pt then catalysis-assisted growthglass, silicon, PVC, PDMS, parylene, cotton and nylon with patterned Pt · feature sizes micrometres to centimetres; thickness varies | 17061 · Results and Discussion · Figure 5; Figures S18-S22 |
| edge-on Ni3(HITP)2 filmresearch_0504__mat__mat_ni_hitp | Thin Film · Target Sample · Pristine Framework | O2-saturated edge-on Ni/HATP/NaOAc route; time not text-reportedPt-coated silicon · not text-reported | 32 · Supplementary data · Figure S29 |
| face-on Ni3(HITP)2 film, 60 minresearch_0504__mat__mat_ni_hitp | Thin Film · Target Sample · Pristine Framework | O2-saturated Ni/HATP/NaOAc route, 1 h0.3 nm Pt-coated silicon · domains ~55 nm parallel and 570 nm perpendicular to substrate | 17061 · Results and Discussion · Figure 4 |
| Zn3(HHTP)2 film, 30 minresearch_0504__mat__mat_zn_hhtp | Thin Film · Target Sample · Pristine Framework | room-temperature catalysis-assisted immersion, 30 min0.3 nm Pt-coated substrate · not text-reported | 15 · Supplementary data · Figure S12 |