Diffraction Structure — Catalysis-Assisted Synthesis of Two-Dimensional Conductive Metal–Organic Framework Films with Controllable Orientation

5 measurement groups · 14 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu2TBA film, 60 min · Thin Film

Cu2TBA film after 60 min reaction

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu2TBA film formation	SEM/XRD/FT-IR evidence; numeric figure values not text-reported	—	—	Caption Qualitative	17-18 · Supplementary data · Figures S14-S15

face-on Cu3(HHTP)2 film on silicon, 60 min · Thin Film

Top-view/cross-sectional SEM; simulated, in-plane and out-of-plane XRD

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
intergrown domain size	~58 nm	—	—	Text Approximate	17060 · Results and Discussion · Figure 2
orientation assignment	face-on; 2D layers parallel to substrate	—	—	Text Qualitative	17060 · Results and Discussion · Figure 2
film thickness	~1720 nm	—	—	Text Approximate	17060 · Results and Discussion · Figure 2
out-of-plane XRD (002) peak	27.92 degree	—	—	Text Exact Reported	17060 · Results and Discussion · Figure 2
in-plane XRD (100) peak	4.74 degree	—	—	Text Exact Reported	17060 · Results and Discussion · Figure 2
in-plane XRD (200) peak	9.48 degree	—	—	Text Exact Reported	17060 · Results and Discussion · Figure 2
in-plane XRD (210) peak	12.56 degree	—	—	Text Exact Reported	17060 · Results and Discussion · Figure 2
in-plane XRD (220) peak	16.44 degree	—	—	Text Exact Reported	17060 · Results and Discussion · Figure 2

edge-on Ni3(HITP)2 film · Thin Film

Edge-on Ni3(HITP)2 film on silicon

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
edge-on Ni3(HITP)2 film formation	SEM/XRD evidence; numeric values not text-reported	—	—	Caption Qualitative	32 · Supplementary data · Figure S29

face-on Ni3(HITP)2 film, 60 min · Thin Film

Top-view/cross-sectional SEM and in-plane/out-of-plane XRD

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni3(HITP)2 orientation	face-on orientation from out-of-plane (002) peak	—	—	Text Qualitative	17061 · Results and Discussion · Figure 4
Ni3(HITP)2 domain parallel to substrate	~55 nm	—	—	Text Approximate	17061 · Results and Discussion · Figure 4
Ni3(HITP)2 domain perpendicular to substrate	570 nm	—	—	Text Exact Reported	17061 · Results and Discussion · Figure 4

Zn3(HHTP)2 film, 30 min · Thin Film

Zn3(HHTP)2 film after 30 min reaction

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Zn3(HHTP)2 film formation	SEM/EDX/XRD/FT-IR evidence; numeric figure values not text-reported	—	—	Caption Qualitative	15-16 · Supplementary data · Figures S12-S13