GIXRD / XRD with Williamson-Hall fitting
Optimised 12-cycle Cu3(HHTT)2 film on SiO2/Si · Thin Film
Out-of-plane and in-plane GIXRD on 132 nm optimised film prepared from 1 mM Cu(OAc)2 / 0.1 mM HHTT ethanol on SiO2/Si.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| W-H average crystalline size | 6.3 nm | — | — | Text Exact Reported | p003 · Results and Discussion · Figure S6b |
| In-plane GIXRD peaks | 2theta = 4.2, 8.5, 13.6 deg indexed as (100), (200), (220) | — | — | Text Exact Reported | p003 · Results and Discussion · Figure 1d |
| Out-of-plane GIXRD peak | 2theta = 27.9 deg assigned to (001) | — | — | Text Exact Reported | p003 · Results and Discussion · Figure 1d |
| Interlayer distance | about 0.32 nm | — | — | Text Approximate | p003 · Results and Discussion · Figure 1a |
| W-H microstrain | 4.1% | — | — | Text Exact Reported | p003 · Results and Discussion · Figure S6b |
| Framework pore size | about 2.5 nm | — | — | Text Approximate | p003 · Results and Discussion · Figure 1a |