Diffraction Structure — Impact of the Channel Length in Nanoporous Electric Double-Layer Capacitors on the Charge Transport Explored by Metal-Organic Framework Films

Measurement evidence

Diffraction Structure

Impact of the Channel Length in Nanoporous Electric Double-Layer Capacitors on the Charge Transport Explored by Metal-Organic Framework Films · Liu Y., Chandresh A., Heinke L. · ACS Physical Chemistry Au · 2025 · 266-273

2 measurement groups · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Structural assignment from molecular structure and literature-supported Cu3(HHTP)2 model

Cu3(HHTP)2 SURMOF synthesis-cycle series · Thin Film

Used as structural basis for ion transport interpretation; pore diameter described in main text.

Context: pristine conductive MOF
Measurement source: 267 · Introduction · Figure 1a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
One-dimensional pore/channel diameter	approximately 2 nm	—	—	Text Approximate	267 · Introduction

In-plane and out-of-plane X-ray diffraction

X-ray diffraction and scattering

Cu3(HHTP)2 SURMOF synthesis-cycle series · Thin Film

Bruker D8 ADVANCE X-ray diffractometer with Cu K alpha radiation; 20- and 200-cycle SURMOF films compared with calculated XRD pattern.

Geometry: oriented thin film on gold-coated silicon wafer
Context: pristine conductive MOF thin films
Measurement source: 268 · Characterizations; Results and Discussion · Figure 1b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Crystallinity and preferred orientation	20- and 200-cycle films are crystalline and highly oriented, with layers parallel to substrate and channels perpendicular to substrate	—	—	Text Qualitative	268 · Results and Discussion · Figure 1b