SEM top-view and cross-sectional imaging
Cu3(HHTP)2 SURMOF synthesis-cycle series · Thin Film
TESCAN VEGA3 SEM; samples coated with 3-4 nm platinum before imaging; four cross-sectional broken-sample views used for thickness averages.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| 200-cycle average film thickness | 540 +/- 40 nm | — | +/- 40 nm | Caption Rounded Reported | SI p. 2 · Figure S1 caption · Figure S1 |
| 200-cycle individual cross-section thicknesses | 555, 590, 495 and 515 nm | — | — | Caption Exact Reported | SI p. 2 · Figure S1 caption · Figure S1 |
| 20-cycle average film thickness | 70 +/- 10 nm | — | +/- 10 nm | Caption Rounded Reported | SI p. 2 · Figure S1 caption · Figure S1 |
| 20-cycle individual cross-section thicknesses | 85, 65, 55 and 70 nm | — | — | Caption Exact Reported | SI p. 2 · Figure S1 caption · Figure S1 |
| Thickness increase from 20 to 200 cycles | approximately 8 times | — | — | Text Approximate | 268 · Results and Discussion · Figure S1 |