Electrical Transport — Simultaneous defect passivation and hole mobility enhancement of perovskite solar cells by incorporating anionic metal-organic framework into hole transport materials

8 measurement groups · 16 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PSC with HTM-FJU-17 DFL · Electrode

Dark J-V initiation-position comparison between pristine HTM and HTM-FJU-17 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
dark-current initiation position HTM-FJU-17Marked as a best value within this paper	0.95 V	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1c
dark-current initiation position pristine HTM	0.85 V	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1c

PSC with HTM-FJU-17 DFL · Electrode

1 Hz to 10^5 Hz at 0.9 V in dark; fitted by Z-view; Rct for pristine HTM and HTM-FJU-17 PSCs.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EIS series resistance Rs HTM-FJU-17Marked as a best value within this paper	25.3 ohm	—	—	SI Table Exact Reported	14 · Table S3 · Table S3
EIS series resistance Rs pristine HTM	29.5 ohm	—	—	SI Table Exact Reported	14 · Table S3 · Table S3
charge transport resistance Rct HTM-FJU-17Marked as a best value within this paper	151 ohm	—	—	SI Table Exact Reported	14 · Table S3 · Table S3
charge transport resistance Rct pristine HTM	192 ohm	—	—	SI Table Exact Reported	14 · Table S3 · Table S3

HTM-FJU-17 DFL film · Thin Film

HTM-FJU-17 film from 10 to 100 degC.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
temperature-dependent HTM film conductivity	conductivity increases with temperature after introducing FJU-17 and remains stable/conductive at 100 degC	—	—	Text Qualitative	4 · 3. Results and discussion · Fig. S9c

PSC with HTM-FJU-17 DFL · Electrode

Reverse saturated current density derived from J-V analysis.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
reverse saturated current density J0 HTM-FJU-17Marked as a best value within this paper	8.80 x 10-9 mA cm-2	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1h
reverse saturated current density J0 pristine HTM	1.12 x 10-5 mA cm-2	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1h

HTM-FJU-10 film · Thin Film

HTM-FJU-10 control film compared with pristine HTM.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PCE for HTM-FJU-10 device	17.56%	—	—	Text Rounded Reported	10 · Figure S12 note · Table S7
PCE for FJU-10 control comparison, pristine HTMMarked as a best value within this paper	18.60%	—	—	Text Rounded Reported	10 · Figure S12 note · Table S7
hole mobility HTM-FJU-10	5.83 x 10-4 cm2 (Vs)-1	—	—	Text Exact Reported	Figure S12 note · Fig. S12c

HTM-FJU-17 DFL film · Thin Film

ITO/PEDOT:PSS/HTM/MoO3/Ag hole-only device; HTM-FJU-17 DFL with 0.5 mg FJU-17.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
hole mobility HTM-FJU-17Marked as a best value within this paper	1.05 x 10-3 cm2(Vs)-1	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 2b

pristine HTM film · Thin Film

ITO/PEDOT:PSS/HTM/MoO3/Ag hole-only device; pristine HTM.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
hole mobility pristine HTM	3.11 x 10-4 cm2(Vs)-1	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 2b

PSC with HTM-FJU-17 DFL · Electrode

Series resistance derived from J-V curves for pristine HTM and HTM-FJU-17 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
series resistance Rs HTM-FJU-17Marked as a best value within this paper	0.22 ohm cm2	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1g
series resistance Rs pristine HTM	3.11 ohm cm2	—	—	Text Exact Reported	4 · 3. Results and discussion · Fig. 1g