XPS N atomic percent before and after ageing
HTM-FJU-17 DFL film · Thin Film
HTM-FJU-17 layer before and after ageing for 120 h to confirm Me2NH2+ release.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| N atomic percent after 120 h ageing | 5.79% | — | — | Text Exact Reported | Figure S10 note · Fig. S10 |
| N atomic percent before ageing | 7.02% | — | — | Text Exact Reported | Figure S10 note · Fig. S10 |