X-ray diffractometry (XPert3, PANalytical)
48 h TCNQ-Cu3(BTC)2 SPE · Electrode
XRD patterns of Cu3(BTC)2 and TCNQ-Cu3(BTC)2 compared.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Additional XRD peak after TCNQ infiltration | 2theta of 5.7 degrees | — | — | Text Exact Reported | 4 · 3.4 Structural and morphological studies · Fig. S3 |